Zobrazeno 1 - 10
of 80
pro vyhledávání: '"Spry, David"'
Autor:
Gaddam, Venkateswarlu, Dabas, Shaurya S., Gao, Jinghan, Spry, David J., Baucom, Garrett, Rudawski, Nicholas G., Yin, Tete, Angerhofer, Ethan, Neudeck, Philip G., Kim, Honggyu, Feng, Philip X. -L., Sheplak, Mark, Tabrizian, Roozbeh
Aluminum scandium nitride (AlScN) has emerged as a highly promising material for high-temperature applications due to its robust piezoelectric, ferroelectric, and dielectric properties. This study investigates the behavior of Al0.7Sc0.3N thin films i
Externí odkaz:
http://arxiv.org/abs/2410.17037
Autor:
Spry, David Ben.
Publikováno v:
May be available electronically.
Thesis (Ph. D.)--Stanford University, 2009.
Submitted to the Department of Chemistry. Copyright by the author.
Submitted to the Department of Chemistry. Copyright by the author.
Publikováno v:
Diffusion and Defect Data Part B: Solid State Phenomena; August 2024, Vol. 359 Issue: 1 p125-129, 5p
Autor:
Neudeck, Philip G., Chen, Liang Yu, Greer, Lawrence C., Spry, David J., Prokop, Norman F., Lukco, Dorothy, Krasowski, Michael J., Hunter, Gary W.
Publikováno v:
Diffusion and Defect Data Part B: Solid State Phenomena; August 2024, Vol. 358 Issue: 1 p7-12, 6p
Akademický článek
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Autor:
Wegrowe, Jean-Eric, Friedman, Joseph S., Razeghi, Manijeh, Hart, Daniel R., Spry, David J., Sissay, Adonay A., Burgess, Kaila N., Maeda, Kenji
Publikováno v:
Proceedings of SPIE; September 2023, Vol. 12656 Issue: 1 p126560P-126560P-6, 1139047p
Publikováno v:
Key Engineering Materials; June 2023, Vol. 948 Issue: 1 p83-88, 6p
Publikováno v:
Key Engineering Materials; June 2023, Vol. 948 Issue: 1 p77-82, 6p
Autor:
Neudeck, Philip G.1 Neudeck@nasa.gov, Spry, David J.1, Krasowski, Michael J.1, Prokop, Norman F.1, Beheim, Glenn M.1, Liang-Yu Chen2, Chang, Carl W.3
Publikováno v:
Journal of Microelectronic & Electronic Packaging. Oct2018, Vol. 15 Issue 4, p163-170. 8p.
Autor:
Neudeck, Philip G., Spry, David J., Krasowski, Michael J., Chang, Carl W., Gonzalez, José M., Rajgopal, Srihari, Prokop, Norman F., Greer, Lawrence C., Lukco, Dorothy, Maldonado-Rivera, Shamir, Adams, Christina M.
Publikováno v:
Advancing Microelectronics; 2024, Vol. 51 Issue 2, p32-37, 6p