Zobrazeno 1 - 10
of 7 684
pro vyhledávání: '"Spm"'
Autor:
ZHANG Tingyi, WANG Hongjian
Publikováno v:
Jisuanji kexue yu tansuo, Vol 18, Iss 6, Pp 1491-1512 (2024)
To improve the solving accuracy and local extremum escape ability of chimpanzee optimization algorithm (ChOA), this paper proposes a street lamp shadow imaging and running away from home strategy for improved chimpanzee optimization algorithm (SSR-Ch
Externí odkaz:
https://doaj.org/article/c67baf7a55aa461a9758bbc695e8f42c
Publikováno v:
FirePhysChem, Vol 4, Iss 2, Pp 95-106 (2024)
With the development of micro-spacecraft technology, micro-nano satellites have the advantages of small size, low power consumption, short development cycle, formation networking, etc., and can complete many complex space tasks at a lower cost. Micro
Externí odkaz:
https://doaj.org/article/0cf1259109534839ab54382179798390
Publikováno v:
VINE Journal of Information and Knowledge Management Systems, 2022, Vol. 54, Issue 3, pp. 531-560.
Autor:
DOĞAN, Nilgün1 ndogan@gumushane.edu.tr, ADANACIOĞLU, Hakan2
Publikováno v:
Turkish Journal of Agricultural & Natural Sciences. 2024, Vol. 11 Issue 1, p140-148. 9p.
Autor:
Zhidan Wen, Qiang Wang, Yue Ma, Pierre Andre Jacinthe, Ge Liu, Sijia Li, Yingxin Shang, Hui Tao, Chong Fang, Lili Lyu, Baohua Zhang, Kaishan Song
Publikováno v:
International Soil and Water Conservation Research, Vol 12, Iss 1, Pp 200-216 (2024)
Suspended particulate matter (SPM) in lakes exerts strong impact on light propagation, aquatic ecosystem productivity, which co-varies with nutrients, heavy metal and micro-pollutant in waters. In lakes, SPM exerts strong absorption and backscatterin
Externí odkaz:
https://doaj.org/article/314333c2efe245a7a24556634701fe47
Autor:
Md Ashiqur Rahman Laskar, Giuseppe Leonetti, Gianluca Milano, Ondřej Novotný, Jan Neuman, Sefaattin Tongay, Umberto Celano
Publikováno v:
Advanced Materials Interfaces, Vol 11, Iss 21, Pp n/a-n/a (2024)
Abstract Controlling nanoscale tip‐induced material removal is crucial for achieving atomic‐level precision in tomographic sensing with atomic force microscopy (AFM). While advances have enabled volumetric probing of conductive features with nano
Externí odkaz:
https://doaj.org/article/e3bb0c8aa4444ef5b3ed02e1ef52e1eb
Autor:
P. Lagrain, K. Paulussen, E. Grieten, G. Van den Bosch, S. Rachidi, D. Yudistira, L. Wouters, T. Hantschel
Publikováno v:
Micro and Nano Engineering, Vol 23, Iss , Pp 100247- (2024)
Focused ion beam (FIB) has become a powerful tool for transmission electron microscopy sample preparation in the nanoelectronics industry and has in recent years also shown its benefits for specific preparation steps in electrical scanning probe micr
Externí odkaz:
https://doaj.org/article/d5a4ea81a68e4d849bd039a490c67128