Zobrazeno 1 - 10 of 25 pro vyhledávání: '"Spinitronics"'
1
PFS - Embedded memory testing: from power measurements to defect encoding
Autor: Insinga, Giorgio
Publikováno v: UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Memory requirements are constantly increasing in System on Chip (SoC) devices. To keep on with this demand, manufacturers rely on embedded Flash memories that are easily scalable and relatively cheap to manufacture. These memories usually take a larg
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::c716ebdde34134bd2a50fcd848cebd11
https://hdl.handle.net/2117/369986
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2
PFS - Reliability Assessment of Neural Networks in GPUs
Autor: Guerrero-Balaguera, Juan-David
Publikováno v: UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Currently, Deep learning and especially Convolutional Neural Networks (CNNs) have become a fundamental computational approach applied in a wide range of domains, including some safety-critical applications (e.g., automotive, robotics, and healthcare
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::47b07c4aafe67d379903feaaf7d01583
https://hdl.handle.net/2117/369976
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3
PFS - Tools for the Analysis of Simulation Dumps and the Evaluation of Burn-In Techniques
Autor: Calabrese, Andrea
Publikováno v: UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
While the importance of parallel hardware architectures has been increasing over the decades, software tends to be one step behind. In the testing and reliability field, noncommercial software is often designed with few to no parallelism in mind. In
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::de7d03bd3b179eb551f8612dd2044608
https://hdl.handle.net/2117/369972
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5
PFS - Using ML for Back-Annotating Low-Level Effects in a System-Level Framework
Autor: Basharkhah, Katayoon, Navabi, Zainalabedin
Publikováno v: UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
The work presented here is on back-annotation of physical properties into components of an embedded system for system-level simulation and facilitating fast design space exploration. Two important properties, power and noise are considered in this th
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::7ae16a7fdb9c7000d31ebdb7d22b62dd
https://hdl.handle.net/2117/369970
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6
PFS - Control Flow Error Detection Techniques Assessment for Embedded Software Development and Validation
Autor: Solouki, Mohammadreza Amel, Sini, Jacopo, Violante, Massimo
Publikováno v: UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
In this work, a comparative study between established Control Flow Checking (CFC) techniques is presented. A novel test bench is used to inject permanent falts into an emulated microcontroller. This test bench manages all the assessment phases, from
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::5dc2b74fa4467816cba3c57746cd4b00
https://hdl.handle.net/2117/369991
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7
VES3 - Manufacturing and Silicon Lifecycle
Autor: Eggersgluess, Stephan, Tille, Daniel
Publikováno v: UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::376389d2fff24486734f992620b78841
https://hdl.handle.net/2117/369962
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8
PFS - New Solutions for Generating Functional Sequences Maximizing the Sustained Switching Activity of Complex SoCs
Autor: Deligiannis, Nikolaos I.
Publikováno v: UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
It is well known that during device testing, the switching activity (SWA) of the circuit under test (CUT) is an important parameter that must be retained to a minimal value in order to avoid unwanted scenarios on the CUTs (e.g., over-stressing) that
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::7558c1177d6add8210f6e624b9ed52ea
https://hdl.handle.net/2117/369981
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9
VES1 - ATE and Test Quality
Autor: Eggersgluess, Stephan
Publikováno v: UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Improving Test Quality and Reliability via In-system/In-field Testing Lee HARRISON (Siemens EDA – United Kingdom) How ACS enables an Open Innovation Ecosystem for AI/ML applications in the Semiconductor Value Chain Matthias SAUER, Sonny BANWARI (AD
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::a9c7727771fb85eec816c468608aa153
https://hdl.handle.net/2117/369968
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10
ICS1 - Industry Case-Study Presentations Session 1
Autor: Dobbelaere, Wim, Appello, Davide
Publikováno v: UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Strategies for Enabling Quantum Development with Test and Measurement at millikelvin range focusing on pre-characterization. Jack DEGRAVE1, Philip KRANTZ2, Dong-Thuc KNOBBE1 1FormFactor, USA, 2Keysight, USA Challenges and Solutions for Automotive Col
Externí odkaz: https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::57521f653ecd0c0f6e5f5a81081725e2
https://hdl.handle.net/2117/370001
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