Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Spengen, W.M. van"'
Autor:
Disseldorp, E.C.M., Tabak, F.C., Wortel, G.H., Katan, A.J., Hesselberth, M.B.S., Oosterkamp, T.H., Frenken, J.W.M., Spengen, W.M. van
Publikováno v:
Review of Scientific Instruments, 81(4), 043702
Review of Scientific Instruments
Review of Scientific Instruments
The high speed performance of a scanning probe microscope (SPM) is improved if a microelectromechanical systems (MEMS) device is employed for the out-of-plane scanning motion. We have carried out experiments with MEMS high-speed z-scanners (189 kHz f
Autor:
Disseldorp, E.C.M., Tabak, F.C., Katan, A.J., Hesselberth, M.B.S., Oosterkamp, T.H., Frenken, J.W.M., Spengen, W.M. van
Publikováno v:
Review of Scientific Instruments, 81(11), 117102
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::62f9b986081724f91bf13aeea8aded62
https://hdl.handle.net/1887/61308
https://hdl.handle.net/1887/61308
Autor:
Tabak, F.C.
Publikováno v:
Casimir PhD Series
In this thesis, two routes towards high-speed scanning tunneling microscopy (STM) are described. The first possibility for high-speed scanning that is discussed is the use of MEMS (Micro-Electro Mechanical Systems) devices as high-speed add-ons in ST
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::515aa6fee9bd2f1ee2a4448647dcc042
https://hdl.handle.net/1887/20925
https://hdl.handle.net/1887/20925