Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Spencer K. Millican"'
Autor:
Yang Sun, Spencer K. Millican
Publikováno v:
Journal of Electronic Testing. 38:339-352
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::94905d892152844745b213d0744d07ff
https://doi.org/10.1007/s10836-022-06016-9
https://doi.org/10.1007/s10836-022-06016-9
Publikováno v:
2022 IEEE 31st Microelectronics Design & Test Symposium (MDTS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0a363a77047068f0816afce4f86dc7c3
https://doi.org/10.1109/mdts54894.2022.9826985
https://doi.org/10.1109/mdts54894.2022.9826985
Publikováno v:
Journal of Electronic Testing. 36:123-133
This article analyzes and rationalizes the capabilities of inversion test points (TPs) when implemented in lieu of traditional test point architectures. With scaling transistor density, logic built-in self-test (LBIST) quality degrades and additional
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::1ead6029d6423659af6936bea62fcf88
https://doi.org/10.1007/s10836-020-05859-4
https://doi.org/10.1007/s10836-020-05859-4
Autor:
SueAnne Griffith, Spencer K. Millican
Publikováno v:
CODES+ISSS
This work presents a plan for investigating transistor aging and degradation in cyber physical systems under attack. The authors discuss the importance of such concerns, particularly with regard to negative bias temperature instability, and an approa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::16104df8bd1cfe02731b1e20d1bea9a0
https://doi.org/10.1145/3478684.3479251
https://doi.org/10.1145/3478684.3479251
Publikováno v:
ETS
The exponential complexity of automatic test pattern generation (ATPG) necessitates the use of heuristics in making choices during test generation. However, in practice no single heuristic fits all situations. Unsupervised learning can combine any nu
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::43b4c5543738cc1c1ab6748315d74eb1
https://doi.org/10.1109/ets50041.2021.9465403
https://doi.org/10.1109/ets50041.2021.9465403
Publikováno v:
2021 IEEE Microelectronics Design & Test Symposium (MDTS).
In a machine intelligence (MI)-based automatic test pattern generator (ATPG), an artificial neural network (ANN) may guide decisions that would otherwise rely on some heuristic. Heuristics use circuit-specific data such as gate types, logic depth, fa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e2fba4812a7e798b3e5d906ce04c5126
https://doi.org/10.1109/mdts52103.2021.9476085
https://doi.org/10.1109/mdts52103.2021.9476085
Publikováno v:
ISMVL
Consumer demands are outgrowing the benefits of technology scaling, especially for binary circuits. Previous studies proposed multi-valued logic (MVL) architectures, but these architectures use non-standard fabrication techniques and optimistic perfo
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::19efcbe9da390562159f29cf37ed7f64
https://doi.org/10.1109/ismvl51352.2021.00036
https://doi.org/10.1109/ismvl51352.2021.00036
Publikováno v:
VTS
Integrated circuit (IC) testing presents complex problems that, when ICs become large, are exceptionally difficult to solve by traditional computing techniques. To deal with unmanageable time complexity, engineers often rely on human “hunches” an
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cc7cb853f8c85bf7653eb8de3db9d811
https://doi.org/10.1109/vts50974.2021.9441051
https://doi.org/10.1109/vts50974.2021.9441051
Publikováno v:
FPGA
Technology scaling cannot meet consumer demands, especially for binary circuits. Previous studies proposed addressing this with multi-valued logic (MVL) architectures, but these architectures use non-standard fabrication techniques and optimistic per
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c10bff2b14751668221d49875c44dfea
https://doi.org/10.1145/3431920.3439471
https://doi.org/10.1145/3431920.3439471
Publikováno v:
VLSI Design
Recent research shows that an artificial neural network (ANN) can combine multiple heuristics to guide an automatic test pattern generator (ATPG) with fewer backtracks than required by guidance from any single heuristic. Thus motivated, we develop a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a3fdc3158fd1c6f5b59ae967b28c86b4
https://doi.org/10.1109/vlsid51830.2021.00059
https://doi.org/10.1109/vlsid51830.2021.00059