Zobrazeno 1 - 10
of 8 229
pro vyhledávání: '"Spectroscopic Ellipsometry"'
Autor:
Soraya Zangenehzadeh, Emil Agocs, Fenja Schröder, Nassima Amroun, Rebekka Biedendieck, Dieter Jahn, Axel Günther, Lei Zheng, Bernhard Roth, Hans-Hermann Johannes, Wolfgang Kowalsky
Publikováno v:
Scientific Reports, Vol 14, Iss 1, Pp 1-11 (2024)
Abstract In this work, we report on the application of the polarization modulated spectroscopic ellipsometry-based surface plasmon resonance method for sensitive detection of microorganisms in Kretschmann configuration. So far, rotating analyzer and
Externí odkaz:
https://doaj.org/article/08ba5b4f24c94d698bde8e258809613c
Autor:
Anna Szekeres, Sashka Alexandrova, Mihai Anastasescu, Hermine Stroescu, Mariuca Gartner, Peter Petrik
Publikováno v:
Micro, Vol 4, Iss 3, Pp 426-441 (2024)
Nanoscale oxides grown in c-silicon, implanted with low-energy (2 keV) H+ ions and fluences ranging from 1013 cm−2 to 1015 cm−2 by RF plasma immersion implantation (PII), have been investigated. The oxidation of the implanted Si layers proceeded
Externí odkaz:
https://doaj.org/article/dbb68e48a7e44addb3220f9bf75b3493
Autor:
Seref Kalem
Publikováno v:
Scientific Reports, Vol 14, Iss 1, Pp 1-9 (2024)
Abstract The silicon suboxide SiOx (x
Externí odkaz:
https://doaj.org/article/b26dd565e88148248f96dcbcf17044e0
Autor:
Jorge Luis Vazquez‐Arce, Tibor Suta, Bálint Fodor, László Makai, Oscar Contreras, Amin Bahrami, Kornelius Nielsch, Hugo Tiznado
Publikováno v:
Advanced Materials Interfaces, Vol 11, Iss 26, Pp n/a-n/a (2024)
Abstract This study analyzes the optical properties of TiO2 films grown via atomic layer deposition (ALD) using Tetrakis(dimethylamino)titanium with oxidizing agents such as H2O, H2O2, O3, and O2‐plasma. TiO2‐H2O exhibited Ti3+ states and oxygen
Externí odkaz:
https://doaj.org/article/597f5de8b7554c01b61e2fd1d2754f2c
Publikováno v:
Nanophotonics, Vol 13, Iss 7, Pp 1181-1189 (2024)
As a non-destructive and rapid technique, optical scatterometry has gained widespread use in the measurement of film thickness and optical constants. The recent advances in deep learning have presented new and powerful approaches to the resolution of
Externí odkaz:
https://doaj.org/article/fd1eaf9e86834108a578191b97a6b71a
Autor:
Zhe Chuan Feng, Ming Tian, Xiong Zhang, Manika Tun Nafisa, Yao Liu, Jeffrey Yiin, Benjamin Klein, Ian Ferguson
Publikováno v:
Nanomaterials, Vol 14, Iss 21, p 1769 (2024)
AlGaN is attractive for fabricating deep ultraviolet (DUV) optoelectronic and electronic devices of light-emitting diodes (LEDs), photodetectors, high-electron-mobility field-effect transistors (HEMTs), etc. We investigated the quality and optical pr
Externí odkaz:
https://doaj.org/article/a08b91d0c63b4b2588c06c4269cf9bd1
Autor:
Despoina Tselekidou, Kyparisis Papadopoulos, Konstantinos C. Andrikopoulos, Aikaterini K. Andreopoulou, Joannis K. Kallitsis, Stergios Logothetidis, Argiris Laskarakis, Maria Gioti
Publikováno v:
Nanomaterials, Vol 14, Iss 20, p 1623 (2024)
Polymers containing π-conjugated segments are a diverse group of large molecules with semiconducting and emissive properties, with strong potential for use as active layers in Organic Light-Emitting Diodes (OLEDs). Stable blue-emitting materials, wh
Externí odkaz:
https://doaj.org/article/f17d3385cb874411a2606ffa890000f1
Publikováno v:
Results in Optics, Vol 15, Iss , Pp 100640- (2024)
Spectroscopic ellipsometry is a reproducible and non-invasive characterization technique that allows the evaluation of multilayered structures. However, it is an indirect technique and requires the use of well-calibrated models to correctly analyze t
Externí odkaz:
https://doaj.org/article/3567f3ec456d49d0958ea6550a9b7985