Zobrazeno 1 - 1
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pro vyhledávání: '"Soundararajan Thirumavalavan"'
Publikováno v:
Materials Research, Vol 18, Iss 5, Pp 1000-1007 (2015)
AbstractCopper selenide (CuSe) thin films were prepared by chemical bath deposition (CBD) method. X-ray diffraction (XRD) analysis was used to study the structure and crystallite size of CuSe thin film. The grain size and the surface morphology were
Externí odkaz:
https://doaj.org/article/a01a914969f64a97889822253830cfb7
