Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Soufiene Krimi"'
Publikováno v:
IEEE Journal of Selected Topics in Quantum Electronics. 23:1-12
In this contribution, an advanced numerical regression approach based on graphics processing unit is introduced. The approach has been applied for real-time terahertz thickness measurements of individual layers within multilayered structures for a va
Autor:
Ralph Urbansky, G. von Freymann, Soufiene Krimi, Joachim Jonuscheit, Rene Beigang, Jens Klier
Publikováno v:
2016 41st International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz).
We present a highly accurate self-calibrating approach to investigate ceramic thermal barrier coatings on metallic substrates using terahertz (THz) technique in reflection geometry. The proposed approach enables the simultaneous determination of the
Autor:
Soufiene Krimi, Frank Ellrich, Rene Beigang, Jens Klier, Joachim Jonuscheit, Ralph Urbansky, G. von Freymann
Publikováno v:
2015 40th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz).
We present a novel numerical approach to decrease the limits of the minimum paint thickness measurements of individual layers in multilayered structures using terahertz pulsed technique in reflection geometry. This method combines the benefits of mod
Publikováno v:
Proceedings of 40th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz)
The multilayer structure of an ultra-high molecular weight polyethylene composite material was investigated in the terahertz (THz) spectral range by means of time domain spectroscopy (TDS) technique. Such structures consist of many alternating layers
Autor:
Thorsten Sprenger, Frank Ellrich, Georg von Freymann, Christoph Fredebeul, Joachim Jonuscheit, Konstantinos Nalpantidis, Daniel Molter, Daniel Hübsch, Frank Platte, Soufiene Krimi, Tobias Wurschmidt
Publikováno v:
2014 39th International Conference on Infrared, Millimeter, and Terahertz waves (IRMMW-THz).
Terahertz (THz) spectroscopy is a powerful technique for identification of dangerous materials like drugs and explosives, especially when hidden under optically opaque concealments. Multiple-reflections within such sample systems lead to additional s
Publikováno v:
2013 38th International Conference on Infrared, Millimeter, and Terahertz Waves (IRMMW-THz).
We present a novel approach to determine the individual layer thickness in a dielectric multilayer sample using pulsed terahertz spectroscopy in reflection geometry. In a first step, the optical parameters of each layer have to be determined. Based o
Autor:
Georg von Freymann, Rene Beigang, Soufiene Krimi, Joachim Jonuscheit, Jens Klier, Ralph Urbansky
Publikováno v:
Applied Physics Letters. 109:021105
In this contribution, we present a highly accurate approach for thickness measurements of multi-layered automotive paints using terahertz time domain spectroscopy in reflection geometry. The proposed method combines the benefits of a model-based mate
Autor:
Norbert Palka, Rene Beigang, Roman Gieleta, Danuta Miedzińska, Soufiene Krimi, Marcin Małek, Frank Ospald
Publikováno v:
Journal of Infrared, Millimeter, and Terahertz Waves. 36(6):578-596
The multilayer structure of an ultra-high molecular weight polyethylene (UHMWPE) composite material was investigated in the terahertz (THz) spectral range by means of time-domain spectroscopy (TDS) technique. Such structures consist of many alternati