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pro vyhledávání: '"Sota Mogi"'
Publikováno v:
Japanese Journal of Applied Physics. 61:018004
Spectroscopic ellipsometry is a powerful tool for the characterization of thin films/surfaces. To simultaneously extract optical constant and film thickness from ellipsometric parameters ψ and Δ, dispersion models of material’s refractive index a
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f998000854a3a1ecf9cce8cb700b02f5
https://doi.org/10.35848/1347-4065/ac42af
https://doi.org/10.35848/1347-4065/ac42af
