Near-edge optical absorption behavior of sputter deposited hafnium dioxide.

Autor: Hoppe, E. E., Sorbello, R. S., Aita, C. R.

Publikováno v: Journal of Applied Physics; 6/15/2007, Vol. 101 Issue 12, p123534, 6p, 1 Chart, 6 Graphs

Optical absorption behavior of ZrO[sub 2]–TiO[sub 2] nanolaminate films.

Autor: Aita, C. R., DeLoach, J. D., Sorbello, R. S.

Publikováno v: Journal of Applied Physics; 7/1/2003, Vol. 94 Issue 1, p654, 10p, 1 Diagram, 4 Charts, 10 Graphs

Electromigration-induced failure and reliability of metallizations in integrated circuits.

Autor: Itskovich, I. F., Sorbello, R. S.

Publikováno v: Journal of Applied Physics; 7/15/1993, Vol. 74 Issue 2, p983, 5p

Crystallization and (Al,Ti)-oxide growth in annealed TiO2–Al2O3 multilayers.

Autor: Omari, M. A., Sorbello, R. S., Aita, C. R.

Publikováno v: Journal of Vacuum Science & Technology: Part A-Vacuums, Surfaces & Films; Mar2006, Vol. 24 Issue 2, p317-323, 7p, 1 Black and White Photograph, 1 Diagram, 5 Charts, 3 Graphs

Dielectric function of thin-film titanium oxide with a granular nanostructure.

Autor: Sorbello, R. S., DeLoach, J. D., Aita, C. R., Fejes, P.

Publikováno v: Journal of Vacuum Science & Technology: Part B-Microelectronics & Nanometer Structures; 2004, Vol. 22 Issue 6, p2658-2662, 5p