Zobrazeno 1 - 10
of 40
pro vyhledávání: '"Soon Yong Hwang"'
Autor:
Tae Jung Kim, Soon Yong Hwang, Jun Seok Byun, Nilesh S. Barange, Han Gyeol Park, Young Dong Kim
Publikováno v:
AIP Advances, Vol 4, Iss 2, Pp 027124-027124-11 (2014)
The complex dielectric function ɛ and the E0 excitonic and band-edge critical-point structures of hexagonal GaN are reported for temperatures from 30 to 690 K and energies from 0.74 to 6.42 eV, obtained by rotating-compensator spectroscopic ellipsom
Externí odkaz:
https://doaj.org/article/971f98bb9d254ac3a737ba1ed1c4fc16
Publikováno v:
Epidemiology and Health, Vol 41 (2019)
OBJECTIVES Most children and adolescents have low levels of cancer knowledge and awareness, and infrequently engage in preventive behaviors. This study examined the effects of a short classroom-based intervention for cancer prevention on knowledge, a
Externí odkaz:
https://doaj.org/article/d60a5fe3a36a4343b2062e8425ae6bb9
Publikováno v:
Epidemiology and Health
Epidemiology and Health, Vol 41 (2019)
Epidemiology and Health, Vol 41 (2019)
OBJECTIVES: Most children and adolescents have low levels of cancer knowledge and awareness, and infrequently engage in preventive behaviors. This study examined the effects of a short classroom-based intervention for cancer prevention on knowledge,
Autor:
Tae Jung Kim, Soon Yong Hwang, Ingrid Repins, Su-Huai Wei, Jian Li, Young Dong Kim, Clas Persson, Sukgeun Choi
Publikováno v:
Solar Energy Materials and Solar Cells. 130:375-379
Spectroscopic ellipsometry (SE) is used to study the dependence of the band-gap energy for Cu2ZnSnSe4 (CZTSe) on temperature ranging from 50 to 350 K. A CZTSe thin film prepared by the pseudo-bulk approach allows direct observation of the fundamental
Autor:
Junho Choi, Soo Min Hwang, Tae Jung Kim, Soon Yong Hwang, Jinho Joo, Young Dong Kim, Sanghyub Lee, Yu Ri Kang, Jun Young Kim, Han Gyeol Park
Publikováno v:
Journal of Nanoscience and Nanotechnology. 14:8715-8718
The dielectric functions of amorphous GdAlO(x) (GAO) films grown by the sol-gel process were investigated from 1.12 to 8.5 eV as a function of annealing temperature using spectroscopic ellipsometry (SE). A GAO precursor sol with a molar ratio of Gd:A
Autor:
Soon Yong Hwang, David E. Aspnes, Han Gyeol Park, Jin Dong Song, Jun Young Kim, C.-T. Liang, Jae Chan Park, Tae Jung Kim, Jun Seok Byun, E.H. Lee, Yeriaron Kim, Junho Choi, Y.-C. Chang, Yu Ri Kang
Publikováno v:
Current Applied Physics. 14:1273-1276
We report pseudodielectric functions from 1.5 to 6.0 eV of InxAl1 − xP ternary alloy films. Data were obtained by spectroscopic ellipsometry on 1.2 μm thick films grown on (001) GaAs substrates by molecular beam epitaxy. Artifacts were minimized b
Autor:
Junho Choi, Han Gyeol Park, Jae Chan Park, Soon Yong Hwang, Yu Ri Kang, Young Dong Kim, Tae Jung Kim, Jun Seok Byun
Publikováno v:
Journal of the Optical Society of Korea. 18:350-358
The collapse of Langmuir monolayers of arachidic acid (AA) on water at various rates of molecular area compression has been investigated in situ by imaging ellipsometry (IE). The thickness of the collapsed AA molecules, which are inherently inhomogen
Autor:
Soon Yong Hwang, Junho Choi, Han Gyeol Park, Jin Dong Song, Sang Hoon Shin, Young Dong Kim, Jun Young Kim, Tae Jung Kim
Publikováno v:
Journal of the Korean Physical Society. 65:515-519
We report the complex pseudodielectric function = + i of an oxide-free AlSb film for energies from 0.7 to 5.0 eV and temperatures from 300 to 803 K. The 1.5-μm-thick film was grown on a (001) GaAs substrate by using molecular beam epitaxy. We mainta
Publikováno v:
Thin Solid Films. 558:438-442
We report an analytic expression that accurately represents the dielectric functions e = e 1 + ie 2 from 1.5 to 6.0 eV of InAs x P 1 − x alloy films over the entire composition range 0 ≤ x ≤ 1. We use the parametric model (PM), which describes
Autor:
Young Dong Kim, Tae Woong Kim, Jinho Joo, Sanghyub Lee, Ju Yun Choi, Hyoungsub Kim, Geun Chul Park, Soo Min Hwang, Jae Jin Yoon, Seung Muk Lee, Tae Jung Kim, Soon Yong Hwang, Jun Hyung Lim
Publikováno v:
Materials Chemistry and Physics. 145:168-175
Ti-silicate/Si films were synthesized using a solution deposition route, and the effects of a rapid thermal process (RTP) on the microstructure, chemical bonding state, and interfacial layer (IL) properties were investigated and correlated to the per