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pro vyhledávání: '"Soon Leng Tan"'
Autor:
Robin Chen, Guo Chang Man, T. L. Yap, Jacobus Leo, Ashesh Sasidharan, Soon Leng Tan, Choon Beng Sia, Jun Hao Tan
Publikováno v:
2020 IEEE 33rd International Conference on Microelectronic Test Structures (ICMTS).
Implementing energy-efficient optical transceiver modules with silicon photonics (SiPh) and 3DIC technologies will help alleviate the increasing energy consumption for hyperscale data centers. To facilitate effective 3DIC heterogenous integration of
Publikováno v:
Microelectronics Reliability. :246-249
Integrated circuit (IC) reliability failure at field presents significant cost to both manufacturer and consumer. This paper targets reliability issue due to IC design weakness, presenting a case of 28 nm Input/Output (I/O) circuit reliability failur