Zobrazeno 1 - 10
of 114
pro vyhledávání: '"Sonza Reorda, Matteo"'
Autor:
Quitadamo, Matteo Vincenzo, Piumatti, Davide, Raviola, Erica, Fiori, Franco, Sonza Reorda, Matteo
Publikováno v:
In Microelectronics Reliability January 2022 128
Akademický článek
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Publikováno v:
In Microelectronics Reliability June 2020 109
Autor:
Limas Sierra, Robert, Guerrero-Balaguera, Juan-David, Condia, Josie E. Rodriguez, Sonza Reorda, Matteo
Publikováno v:
Electronics (2079-9292); Feb2024, Vol. 13 Issue 3, p578, 16p
Autor:
Mirabella, Nunzio, Floridia, Andrea, Cantoro, Riccardo, Grosso, Michelangelo, Sonza Reorda, Matteo
Publikováno v:
2022 29th IEEE International Conference on Electronics, Circuits and Systems (ICECS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f5864d64a4d4cb174a7164f4850eac84
https://doi.org/10.1109/icecs202256217.2022.9971003
https://doi.org/10.1109/icecs202256217.2022.9971003
Autor:
Iaria, Giusy, Angione, Francesco, Bernardi, Paolo, SONZA REORDA, Matteo, Davide, Appello, Giuseppe, Garozzo, Vincenzo, Tancorre
Publikováno v:
2022 IEEE 23rd Latin American Test Symposium (LATS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::da58d5e9a0e2098f8b4a8886521265e8
https://doi.org/10.1109/lats57337.2022.9936975
https://doi.org/10.1109/lats57337.2022.9936975
Autor:
Angione, Francesco, Bernardi, Paolo, Filipponi, Gabriele, SONZA REORDA, Matteo, Davide, Appello, Vincenzo, Tancorre, Roberto, Ugioli
Publikováno v:
2022 IEEE European Test Symposium (ETS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::85eafd84a3fa08b550b0d1beff1ea0b8
https://doi.org/10.1109/ets54262.2022.9810396
https://doi.org/10.1109/ets54262.2022.9810396
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Universitat Politècnica de Catalunya (UPC)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::78bd9afee55e084b7de00906692fa9f6
https://hdl.handle.net/2117/372185
https://hdl.handle.net/2117/372185
Autor:
Amrouch, Hussam, Chakrabarty, Krishnendu, Pflüger, Dirk, Polian, Ilia, Sauer, Matthias, Sonza Reorda, Matteo
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Universitat Politècnica de Catalunya (UPC)
Recent breakthroughs in machine learning (ML) technology are shifting the boundaries of what is technologically possible in several areas of Computer Science and Engineering. This paper discusses ML in the context of test-related activities, includin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::3b82fb87ec94a810ae5a70fcc85ef8a1
http://hdl.handle.net/2117/372165
http://hdl.handle.net/2117/372165
Autor:
Manich Bou, Salvador, Rodríguez Montañés, Rosa, Bernardi, Paolo, Tille, Daniel, Mir, Salvador, Bosio, Alberto, Arumi Delgado, Daniel, Gómez Pau, Álvaro, Cassano, Luca, Jiao, Hailong, Miclea, Liviu, Sanchez, Ernesto, Savino, Alessandro, Canal Corretger, Ramon, Eggersglüß, Stephan, Fransi, Sergi, Taouil, Mottaqiallah, Calomarde Palomino, Antonio, Weiner, Michael, Michael, Maria K., Sonza Reorda, Matteo, Larsson, Erik, Vatajelu, Elena-Ioana, Stratigopoulos, Haralampos-G., Parisi Baradad, Vicenç, Huang, Junlin, Li, Huawei, Chillarige, Sameer, Kameyama, Shuichi, Carro, Luigi, Su, Fei, Nicolici, Nicola, Huang, Shi-Yu
Publikováno v:
UPCommons. Portal del coneixement obert de la UPC
Universitat Politècnica de Catalunya (UPC)
Universitat Politècnica de Catalunya (UPC)
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::39c523cac21ba9160455215e74597409
http://hdl.handle.net/2117/372188
http://hdl.handle.net/2117/372188