Zobrazeno 1 - 10
of 523
pro vyhledávání: '"Song, T. K."'
We performed neutron powder diffraction measurements on (Bi$_{0.5}$Na$_{0.5+x}$)TiO$_3$ and (Bi$_{0.5+y}$Na$_{0.5}$)TiO$_3$ to study structural evolution induced by the non-stoichiometry. Despite the non-stoichiometry, the local structure ($r$$\leq$
Externí odkaz:
http://arxiv.org/abs/1509.01341
Akademický článek
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Autor:
Kim, T. H., Baek, S. H., Jang, S. Y., Yang, S. M., Chang, S. H., Song, T. K., Yoon, J. -G., Eom, C. B., Chung, J. -S., Noh, T. W.
Epitaxial (001) BiFeO3 thin films grown on vicinal SrTiO3 substrates are under large anisotropic stress from the substrates. The variations of the crystallographic tilt angle and the c lattice constant, caused by the lattice mismatch, along the film
Externí odkaz:
http://arxiv.org/abs/1101.0633
Autor:
Yang, S. M., Jo, J. Y., Kim, T. H., Yoon, J. -G., Song, T. K., Lee, H. N., Marton, Z., Park, S., Jo, Y., Noh, T. W.
We investigated nonequilibrium domain wall dynamics under an ac field by measuring the hysteresis loops of epitaxial ferroelectric capacitors at various frequencies and temperatures. Polarization switching is induced mostly by thermally activated cre
Externí odkaz:
http://arxiv.org/abs/1001.5195
We report on epitaxial growth of single-phase [Pb(Zr0.57Ti0.43)O3]0.8[Pb(Fe2/3W1/3)O3]0.2 (PZT-PFW) solid-solution thin films using pulsed laser deposition. X-ray diffraction measurements reveal that the films have a tetragonal structure. The films e
Externí odkaz:
http://arxiv.org/abs/1001.4973
Autor:
Kim, T. H., Baek, S. -H., Yang, S. M., Jang, S. Y., Ortiz, D., Song, T. K., Chung, J. -S., Eom, C. -B., Noh, T. W., Yoon, J. -G.
We describe the directional growth of ferroelectric domains in a multiferroic BiFeO3 thin film, which was grown epitaxially on a vicinal (001) SrTiO3 substrate. A detailed structural analysis of the film shows that a strain gradient, which can create
Externí odkaz:
http://arxiv.org/abs/0909.5566
Autor:
Yang, S. M., Jo, J. Y., Kim, D. J., Sung, H., Noh, T. W., Lee, H. N., Yoon, J. -G., Song, T. K.
We investigated the time-dependent domain wall motion of epitaxial PbZr0.2Ti0.8O3 capacitors 100 nm-thick using modified piezoresponse force microscopy (PFM). We obtained successive domain evolution images reliably by combining the PFM with switching
Externí odkaz:
http://arxiv.org/abs/0805.3207
Autor:
Jo, J. Y., Yang, S. M., Han, H. S., Kim, D. J., Choi, W. S., Noh, T. W., Song, T. K., Yoon, J. -G., Koo, C. -Y., Cheon, J. -H., Kim, S. -H.
We investigated the time-dependent polarization switching behaviors of (111)-preferred polycrystalline Pb(ZrxTi1-x)O3 thin films with various Zr concentrations. We could explain all the polarization switching behaviors well by assuming Lorentzian dis
Externí odkaz:
http://arxiv.org/abs/0710.4178
We investigated domain kinetics by measuring the polarization switching behaviors of polycrystalline Pb(Zr,Ti)O$_{3}$ films, which are widely used in ferroelectric memory devices. Their switching behaviors at various electric fields and temperatures
Externí odkaz:
http://arxiv.org/abs/0704.1053
Thickness-dependence of coercive field (EC) was investigated in ultrathin BaTiO3 capacitors with thicknesses (d) between 30 and 5 nm. The EC appears nearly independent of d below 15 nm, and decreases slowly as d increases above 15 nm. This behavior c
Externí odkaz:
http://arxiv.org/abs/cond-mat/0609064