RecD: Deduplication for End-to-End Deep Learning Recommendation Model Training Infrastructure

Autor: Zhao, Mark, Choudhary, Dhruv, Tyagi, Devashish, Somani, Ajay, Kaplan, Max, Lin, Sung-Han, Pumma, Sarunya, Park, Jongsoo, Basant, Aarti, Agarwal, Niket, Wu, Carole-Jean, Kozyrakis, Christos

We present RecD (Recommendation Deduplication), a suite of end-to-end infrastructure optimizations across the Deep Learning Recommendation Model (DLRM) training pipeline. RecD addresses immense storage, preprocessing, and training overheads caused by

Externí odkaz: http://arxiv.org/abs/2211.05239

A Hybrid Life Cycle Inventory of Nano-Scale Semiconductor Manufacturing

Autor: Krishnan, Nikhil, Boyd, Sarah, Somani, Ajay, Dornfeld, David

Publikováno v: Krishnan, Nikhil; Boyd, Sarah; Somani, Ajay; & Dornfeld, David. (2008). A Hybrid Life Cycle Inventory of Nano-Scale Semiconductor Manufacturing. Laboratory for Manufacturing and Sustainability. UC Berkeley: Laboratory for Manufacturing and Sustainability. Retrieved from: http://www.escholarship.org/uc/item/7931209f

The manufacturing of modern semiconductor devices involves a complex set of nanoscale fabrication processes that are energy and resource intensive, and generate significant waste. It is important to understand and reduce the environmental impacts of

Externí odkaz: https://explore.openaire.eu/search/publication?articleId=od_______325::616a7913748ddeeab40cdcb5e09fb5f7
http://www.escholarship.org/uc/item/7931209f

A hybrid life cycle inventory of nano-scale semiconductor manufacturing.

Autor: Krishnan N; Columbia University, New York, NY, USA. nk2162@columbia.edu, Boyd S, Somani A, Raoux S, Clark D, Dornfeld D

Publikováno v: Environmental science & technology [Environ Sci Technol] 2008 Apr 15; Vol. 42 (8), pp. 3069-75.