Zobrazeno 1 - 10
of 11
pro vyhledávání: '"Solomon Davis"'
Autor:
Solomon Davis, Uri Sivan
Publikováno v:
Nano letters. 22(16)
When generating force curves with atomic force microscopy (AFM), the conventional assumption is that the silicon tip's apex is infinitely stiffer than the force gradient acting between the apex and test object. Although true for measurements in vacuu
Publikováno v:
IEEE/ASME Transactions on Mechatronics. 24:1954-1963
A technology demonstrating a stage capable of positioning an object in the X – Y plane and performing rotation on a thin layer of air without contact is presented. By creating ultrasonic vibrations in an annulus structure, a thin air layer develops
Publikováno v:
The Review of scientific instruments. 91(12)
Publikováno v:
Sensors and Actuators A: Physical. 276:34-42
This paper develops analytically and experimentally an acoustic levitation motor which has the ability to automatically levitate and rotate an object in the air without mechanical contact. To realize such a device, a novel combination of two methods
Publikováno v:
Journal of Vibration and Acoustics. 142
The methods described allow one to directly measure the individual branches of the Campbell diagram of a physical gyroscopic system at any rotation speed. Typically, such data are acquired by exciting the vibration modes through naturally occurring u
Publikováno v:
Physical Review Applied. 12
The phenomenon of $a\phantom{\rule{0}{0ex}}c\phantom{\rule{0}{0ex}}o\phantom{\rule{0}{0ex}}u\phantom{\rule{0}{0ex}}s\phantom{\rule{0}{0ex}}t\phantom{\rule{0}{0ex}}i\phantom{\rule{0}{0ex}}c$ $l\phantom{\rule{0}{0ex}}e\phantom{\rule{0}{0ex}}v\phantom{\
Publikováno v:
Review of Scientific Instruments. 91:113702
Non-contact, frequency modulated atomic force microscopy is often operated in the constant-frequency mode to obtain a height map of the sample's surface. Once linearized, the dynamics of the constant-frequency closed-loop system are reduced to a sing
Publikováno v:
Sensors and Actuators A: Physical. 303:111690
Atomic force microscopy (AFM) is used in the semiconductor industry for inspection and quality control. Frequency modulated AFM (FM-AFM) extracts surface topography by measuring the frequency shift created by the Van der Waals (VdW) interaction force
Publikováno v:
Mechanisms and Machine Science ISBN: 9783319992693
Rotating structures exhibit speed dependent natural frequencies and mode shapes that play an important role in the overall dynamics. Accurate experimental identification of these phenomena is of great importance for validating uncertainties in numeri
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6744c6163ba8505357750132e4ca45a0
https://doi.org/10.1007/978-3-319-99270-9_20
https://doi.org/10.1007/978-3-319-99270-9_20
Publikováno v:
The Review of scientific instruments. 88(4)
We report the development of an instrumentation and control system instantiated on a microprocessor-field programmable gate array (FPGA) device for a harmonic oscillator comprising a portion of a magnetic resonance force microscope. The specific adva