Random Test Generation of Application Programming Interfaces

Autor: Farchi, Eitan, Prakash, Krithika, Sokhin, Vitali

Cloud high quality API (Application Programming Interface) testing is essential for supporting the API economy. Autotest is a random test generator that addresses this need. It reads the API specification and deduces a model used in the test generati

Externí odkaz: http://arxiv.org/abs/2207.13143

Probabilistic Bug-Masking Analysis for Post-Silicon Tests in Microprocessor Verification.

Autor: Doowon Lee, Kolan, Tom, Morgenshtein, Arkadiy, Sokhin, Vitali, Mrad, Ronny, Ziv, Avi, Bertacco, Valeria

Publikováno v: DAC: Annual ACM/IEEE Design Automation Conference; Jun2016, p138-143, 6p

Comparative study of test generation methods for simulation accelerators.

Autor: Kadry, Wisam, Krestyashyn, Dimtry, Morgenshtein, Arkadiy, Nahir, Amir, Sokhin, Vitali, Park, Jin Sung, Park, Sung-Boem, Jeong, Wookyeong, Son, Jae Cheol

Publikováno v: 2015 Design, Automation & Test in Europe Conference & Exhibition (DATE); 2015, p321-324, 4p

Improving Post-silicon Validation Efficiency by Using Pre-generated Data.

Autor: Kadry, Wisam, Koyfman, Anatoly, Krestyashyn, Dmitry, Landa, Shimon, Nahir, Amir, Sokhin, Vitali

Publikováno v: Hardware & Software: Verification & Testing: 9th International Haifa Verification Conference, HVC 2013, Haifa, Israel, November 5-7, 2013, Proceedings; 2013, p166-181, 16p

Threadmill: A Post-Silicon Exerciser for Multi-Threaded Processors.

Autor: Adir, Allon, Golubev, Maxim, Landa, Shimon, Nahir, Amir, Shurek, Gil, Sokhin, Vitali, Ziv, Avi

Publikováno v: DAC: Annual ACM/IEEE Design Automation Conference; Jun2011, p860-865, 6p, 1 Diagram, 1 Chart