Zobrazeno 1 - 10
of 756
pro vyhledávání: '"Soergel, E."'
Publikováno v:
Phys. Rev. B 81, 094109 (2010)
In this $\ll$ contribution we address the question to what extent surface charges affect contact-mode scanning force microscopy measurements. % We therefore designed samples where we could generate localized electric field distributions near the surf
Externí odkaz:
http://arxiv.org/abs/1009.1905
Publikováno v:
Appl. Phys. Lett. 95, 202901 (2009)
Piezoresponse force microscopy (PFM) was used to investigate the ferroelectric properties of sol-gel derived LiNbO$_3$ nanoparticles. To determine the degree of ferroelectricity we took large-area images and performed statistical image-analysis. The
Externí odkaz:
http://arxiv.org/abs/1009.1895
Autor:
Lilienblum, M., Ofan, A., Hoffmann, Á., Gaathon, O., Vanamurthy, L., Bakhru, S., Bakhru, H., Osgood, Jr., R. M., Soergel, E.
Publikováno v:
Appl. Phys. Lett. 96, 082902 (2010)
A scanning force microscope tip is used to write ferroelectric domains in He-implanted single-crystal lithium niobate and subsequently probe them by piezoresponse force microscopy. Investigation of cross-sections of the samples showed that the buried
Externí odkaz:
http://arxiv.org/abs/1009.1907
Translation domains differing in the phase but not in the orientation of the corresponding order parameter are resolved in two types of multiferroics. Hexagonal (h-) YMnO$_3$ is a split-order-parameter multiferroic in which commensurate ferroelectric
Externí odkaz:
http://arxiv.org/abs/1008.3290
Publikováno v:
New. J. Phys. 11, 033029 / 1-14 (2009)
We present a full analysis of the contrast mechanisms for the detection of ferroelectric domains on all faces of bulk single crystals using scanning force microscopy exemplified on hexagonally poled lithium niobate. The domain contrast can be attribu
Externí odkaz:
http://arxiv.org/abs/0803.0171
Publikováno v:
New J. Phys. 10, 013019 (2008)
We present a quantitative investigation of the impact of tip radius as well as sample type and thickness on the lateral resolution in piezoresponse force microscopy (PFM) investigating bulk single crystals. The observed linear dependence of the width
Externí odkaz:
http://arxiv.org/abs/cond-mat/0703793
Publikováno v:
Appl. Phys. Lett. 91, 253510 (2007)
At first sight piezoresponse force microscopy (PFM) seems an ideal technique for the determination of piezoelectric coefficients (PCs), thus making use of its ultra-high vertical resolution (<0.1 pm/V). Christman et al. \cite{Chr98} first used PFM fo
Externí odkaz:
http://arxiv.org/abs/cond-mat/0703402
Publikováno v:
Rev. Phys. Instr. 78, 016101/1-3 (2007)
Commercial atomic force microscopes usually use a four-segmented photodiode to detect the motion of the cantilever via laser beam deflection. This read-out technique enables to measure bending and torsion of the cantilever separately. A slight angle
Externí odkaz:
http://arxiv.org/abs/cond-mat/0610167
Publikováno v:
Appl. Phys. A 86, 353-355 (2007)
Ferroelectric domain imaging with piezoresponse force microscopy (PFM) relies on the converse piezoelectric effect: a voltage applied to the sample leads to mechanical deformations. In case of PFM one electrode is realized by the tip, therefore gener
Externí odkaz:
http://arxiv.org/abs/cond-mat/0607313
Publikováno v:
Appl. Phys. Lett. 89, 042901 (2006)
The contrast mechanism for the visualization of ferroelectric domain boundaries with lateral force microscopy is generally assumed to be caused by mechanical deformation of the sample due to the converse piezoelectric effect. We show, however, that e
Externí odkaz:
http://arxiv.org/abs/cond-mat/0602414