Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Sobol, V. O."'
Autor:
Kolupaev, I. N., Sobol, O. V., Murakhovski, A. V., Koltsova, T. S., Kozlova, M. V., Sobol, V. O.
Multi-threshold slices of an intensity of the optical images of the surface were used for a quantitative assessment of physical and chemical processes on the covering. Computer analysis was applied for testing the real relief by correlation of the im
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3033::5d381e3b7d5938cef08ede3adefbbde3
http://repository.kpi.kharkov.ua/handle/KhPI-Press/59147
http://repository.kpi.kharkov.ua/handle/KhPI-Press/59147
Publikováno v:
Journal of Nano- & Electronic Physics; 2018, Vol. 10 Issue 2, p1-6, 6p
Autor:
Kolypaev, I. M., Sobol', O. V., Myrakhovskiy, O. V., Levitsky, V. S., Larinova, T. V., Koltsova, T. S., Sobol, V. O.
Publikováno v:
2016 International Conference on Nanomaterials: Application & Properties (NAP); 2016, p02CBNM06-5, 0p
Publikováno v:
Eastern-European Journal of Enterprise Technologies; 2018, Vol. 94 Issue 12, p49-55, 7p
Publikováno v:
2016 International Conference on Nanomaterials: Application & Properties (NAP); 2016, p1-7, 7p