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PCM test structures are commonly used to check the produced wafers from the standpoint of the technologist. In general these structures are managed inside the FAB and are focused on standard device properties. Hence their development and analysis is
Autor:
Graupner, Achim, Sobe, Udo
A simple methodology for determining the input referred offset voltage of comparators is presented. This in general is difficult as the output of a comparator is discrete valued. The method relies on a Monte-Carlo-Simulation with certain comparator i
Autor:
Sobe, Udo1 udo.sobe@zmd.de, Rooch, Karl-Heinz1 karl-heinz@zmd.de, Ripp, Andreas2 andreas.ripp@muneda.com, Pronath, Michael2 michael.pronath@muneda.com
Publikováno v:
IEEE Transactions on Semiconductor Manufacturing. May2009, Vol. 22 Issue 2, p217-224. 8p. 4 Black and White Photographs, 3 Diagrams, 3 Charts, 3 Graphs.
