Zobrazeno 1 - 3
of 3
pro vyhledávání: '"Snijders, J. H. M."'
Publikováno v:
J. Electron Spectrosc. Relat. Phenom., 2016
The quantitative lateral resolution is a reliable measure for the quality of an XPS microprobe equipped with a focused X-ray beam. It describes the long tail contributions of the X-ray beam intensity distribution. The knowledge of these long tail con
Externí odkaz:
http://arxiv.org/abs/1605.02692
Autor:
Kuiper, A. E. T., Gillies, M. F., Kottler, V., 't Hooft, G. W., van Berkum, J. G. M., van der Marel, C., Tamminga, Y., Snijders, J. H. M.
Publikováno v:
Journal of Applied Physics; 2/1/2001, Vol. 89 Issue 3, p1965, 8p, 1 Diagram, 11 Graphs
Autor:
Cubaynes, F. N., Venezia, V. C., van der Marel, C., Snijders, J. H. M., Everaert, J. L., Shi, X., Rothschild, A., Schaekers, M.
Publikováno v:
Applied Physics Letters; 4/25/2005, Vol. 86 Issue 17, p172903, 3p, 4 Graphs