Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Snežana M. Đorić-Veljković"'
Publikováno v:
Vojnotehnički Glasnik, Vol 63, Iss 2, Pp 179-194 (2015)
Antropogeni i tehnogeni uticaj na životnu sredinu pojačan je u poslednjoj deceniji XX veka. Taj trend se nastavlja i u XXI veku, a ofanziva globalizacije donosi nove ekološke probleme. Globalni ekološki problemi najviše pogađaju gradove. Izgled
Externí odkaz:
https://doaj.org/article/079c95091f5f42c1a90d6e1b458b3c78
Publikováno v:
Facta universitatis - series: Architecture and Civil Engineering. 16:45-56
Especially geopolymers are novel environmental friendly materials, with promises of considerable progress in the near future. These materials, with unique physical, chemical and mechanical properties can be used for many different applications. They
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d3d25def0e8fa3118ab8d63d4bb6ef4d
https://doi.org/10.2298/fuace161226004j
https://doi.org/10.2298/fuace161226004j
Publikováno v:
Facta universitatis - series: Architecture and Civil Engineering. 16:355-374
Nowadays, it is possible to implement and realize solutions that once seemed inconceivable. Namely, the development of novel technologies allows the implementation of creative ideas, as well as new approach to building design. The use of the state of
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cdbe1575fede41c7ff2318510324fdfb
https://doi.org/10.2298/fuace171129014p
https://doi.org/10.2298/fuace171129014p
Autor:
Snežana M. Đorić-Veljković, Aleksandra R. Zarubica, Predrag Janković, Snežana D. Nikolić-Mandić, Sofija M. Rančić, Aleksandar Bojić
Publikováno v:
Hemijska Industrija, Vol 71, Iss 2, Pp 97-104 (2017)
A new, simple, rapid, sensitive and selective kinetic spectrophotometric method for Pd(II) traces determination was elaborated in this paper. It is based on the catalytic effect of palladium ions upon the oxidation of methylene blue B (MBB) by (NH4)2
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::05d64622525cb2dd67a2b12aadf84a03
http://www.doiserbia.nb.rs/img/doi/0367-598X/2017/0367-598X1400080R.pdf
http://www.doiserbia.nb.rs/img/doi/0367-598X/2017/0367-598X1400080R.pdf
Autor:
Snežana Golubović, Danijel Dankovic, Vojkan Davidovic, Ninoslav Stojadinovic, Ivica Manic, Snežana M. Đorić-Veljković
Publikováno v:
Nuclear Technology and Radiation Protection, Vol 26, Iss 1, Pp 18-24 (2011)
The annealing of radiation-induced defects in burn-in stressed n-channel power VDMOSFETs with thick gate oxides (100 and 120 nm) is analysed. In comparison with the previous spontaneous recovery, the changes of device electrical parameters observed d
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1d805fb5bc37d679e8c4f5cee1ab31e1
https://doi.org/10.2298/ntrp1101018d
https://doi.org/10.2298/ntrp1101018d