Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Smith Lai"'
Autor:
Khader Abdel-Hafez, Michael Dsouza, Likith Kumar Manchukonda, Elddie Tsai, Karthikeyan Natarajan, Ting-Pu Tai, Wenhao Hsueh, Smith Lai
Publikováno v:
2022 IEEE International Test Conference (ITC).
Autor:
Smith Lai, Yukiya Miura, Takaaki Kato, Seiji Kajihara, Harry H. Chen, Masao Aso, Takeshi Iwasaki, Satoshi Matsunaga, Haruo Kobayashi, Yousuke Miyake, Gavin Hung, Kazumi Hatayama, Haruji Futami
Publikováno v:
VTS
The IP session highlights three innovative test practices in Asia, which include a testing solution for the millimeterwave (76- to 81- GHz) without expensive instruments, an on-chip delay measurement method for in-field test and a power control metho