Zobrazeno 1 - 10
of 42
pro vyhledávání: '"Sk. Subidh Ali"'
Autor:
Yogendra Sao, Sk. Subidh Ali
Publikováno v:
IEEE Transactions on Information Forensics and Security. 18:2842-2855
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eb94a10ac5ba964ccaeefabaf968c03e
https://doi.org/10.1109/tifs.2023.3265815
https://doi.org/10.1109/tifs.2023.3265815
Publikováno v:
2022 IEEE European Test Symposium (ETS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::00009b79af45c54fe0d8341b2f20673b
https://doi.org/10.1109/ets54262.2022.9810460
https://doi.org/10.1109/ets54262.2022.9810460
Autor:
Yogendra Sao, Sk Subidh Ali
Publikováno v:
2021 IEEE 39th International Conference on Computer Design (ICCD).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::657b202496e97e7a31f2bc83f369cd91
https://doi.org/10.1109/iccd53106.2021.00096
https://doi.org/10.1109/iccd53106.2021.00096
Publikováno v:
ETS
Scan based DfT is the de facto standard for testing the functional and structural correctness of chips. It provides high observability and controllability of internal latches leading to enhanced fault coverage, but can also induce vulnerability in cr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6e532df12024f2bb0f2cbc52d5aa103d
https://doi.org/10.1109/ets50041.2021.9465427
https://doi.org/10.1109/ets50041.2021.9465427
Publikováno v:
AsianHOST
Scan-based Design for Testability (DfT) provides high fault coverage, observability, and testability of internal nodes of the chip. It can serve as a medium for the attacker to launch a side-channel attack and thus reveal the secret key embedded in t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::49d144fb0c7b511df794396c930bdf44
https://doi.org/10.1109/asianhost51057.2020.9358266
https://doi.org/10.1109/asianhost51057.2020.9358266
Publikováno v:
Microelectronics Reliability. 123:114216
Scan based DfT is indispensable for IC testing in the semiconductor chip industry to ensure correctness of chip, both functionally and structurally. Since a higher degree of fault coverage is essential, cryptographic ICs rely on it as a standard tech
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::f7ad362136c0a69103e711d79fa9b0e3
https://doi.org/10.1016/j.microrel.2021.114216
https://doi.org/10.1016/j.microrel.2021.114216
Publikováno v:
IEEE Transactions on Emerging Topics in Computing. 5:317-328
Scaling down CMOS technology results in excessive power dissipation issues. Nanoelectromechanical System (NEMS) relay technology is an alternative emerging solution that overcomes the power dissipation limitation of CMOS technology. However, despite
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bad8b75bd71f180ab64c0e71158855ee
https://doi.org/10.1109/tetc.2016.2551044
https://doi.org/10.1109/tetc.2016.2551044
Publikováno v:
2019 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::34910144e0c62c349a81a56b0b72ed86
https://doi.org/10.1109/dft.2019.8875272
https://doi.org/10.1109/dft.2019.8875272
Publikováno v:
ACM Transactions on Design Automation of Electronic Systems. 22:1-26
In this article, we present a compact implementation of the Salsa20 stream cipher that is targeted towards lightweight cryptographic devices such as radio-frequency identification (RFID) tags. The Salsa20 stream cipher, ann addition-rotation-XOR (ARX
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5321790ccdbd8750b73ed9d4462ea67d
https://doi.org/10.1145/2934677
https://doi.org/10.1145/2934677
Publikováno v:
IEEE Micro. 36:50-61
During the past few decades, the electronics community has witnessed a growing demand for packing more and more functionalities onto a single chip. The CMOS industry has been fulfilling this demand by continually shrinking the feature sizes, now down
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::11b73a5816bea068218de7235351aff9
https://doi.org/10.1109/mm.2016.87
https://doi.org/10.1109/mm.2016.87