Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Sjaak Bakker"'
Publikováno v:
INSIGHT. 11:29-38
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::2de03636fd65541d4ad668a35bb40711
https://doi.org/10.1002/inst.200811429
https://doi.org/10.1002/inst.200811429
Publikováno v:
INCOSE International Symposium. 18:1340-1354
Protected cultivation systems are used throughout the world as a powerful instrument to produce crops. They protect the crops from unfavorable outdoor climate conditions and pests and offer the opportunity to modify the indoor climate to create an en
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::4844b1b84500061de8e9236ce78dc458
https://doi.org/10.1002/j.2334-5837.2008.tb00882.x
https://doi.org/10.1002/j.2334-5837.2008.tb00882.x
Publikováno v:
Journal of Electronic Testing. 19:417-424
This paper describes an architecture for controlling multiple IEEE 1149.1 compliant TAP controllers on a single digital system chip. The key feature of this architecture is the compatibility with the IEEE 1149.1 standard, and existing debugger softwa
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a1f0310e0f678c27e07e14c9cb075891
https://doi.org/10.1023/a:1024691909923
https://doi.org/10.1023/a:1024691909923
Autor:
Bart Vermeulen, Sjaak Bakker
Publikováno v:
IET Computers & Digital Techniques. 1:678
A comprehensive system debug methodology is presented, which combines the state-of-the-art support for software, functional hardware and process technology debug. The application of this methodology to the 65-nm CMOS En-II SoC is described, containin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ef5331a695be2737bbd365a32adbd73f
https://doi.org/10.1049/iet-cdt:20060217
https://doi.org/10.1049/iet-cdt:20060217
Publikováno v:
Journal of Electronic Testing; Aug2003, Vol. 19 Issue 4, p417-424, 8p