Zobrazeno 1 - 10
of 17
pro vyhledávání: '"Sitian Gao"'
Publikováno v:
Computers & Chemical Engineering. 169:108086
Continuous distillation is an important separation process in chemical engineering curriculum. Conventionally, it is often taught as black box diagrams that lack user visibility, thus preventing students from developing a deeper understanding and com
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::06fe27500f9bfe62e8514b75cc391e62
https://doi.org/10.1016/j.compchemeng.2022.108086
https://doi.org/10.1016/j.compchemeng.2022.108086
Autor:
Sitian Gao, Xiaokang Wang, Song Xiaoping, Pengfei Zha, Axiang Jin, Zhang Airui, Wang Hai, Meiling Wang
Publikováno v:
Spectrochimica Acta Part B: Atomic Spectroscopy. 141:7-14
Quantitative determination of trace elements like S, Fe, Cu, Mn and Pb in gasoline and S in diesel is of great importance due to the growing concerns over air pollution, human health and engine failure caused by utilization of gasoline and diesel wit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e5554895771a544ffcde81cbfb713c3
https://doi.org/10.1016/j.sab.2017.12.009
https://doi.org/10.1016/j.sab.2017.12.009
Autor:
K P Chaudhary, T Watanabe, F. Saraiva, Andreas Just, Konstantin Chekirda, A Lewis, R Bergmans, T Anusorn, F Dvorácek, Antti Lassila, I Victorov, R Thalmann, A Nurul, E. Banreti, J Przybylska, A. Duta, Marco Pisani, J A Salgado, Ralf D. Geckeler, S L Tan, S Zelenika, Peter Cox, R. Fira, Tanfer Yandayan, E. Prieto, Vasilev, Sitian Gao
Publikováno v:
Geckeler, R D, Just, A, Vasilev, V, Prieto, E, Dvorácek, F, Zelenika, S, Przybylska, J, Duta, A, Victorov, I, Pisani, M, Saraiva, F, Salgado, J A, Gao, S, Anusorn, T, Tan, S L, Cox, P, Watanabe, T, Lewis, A, Chaudhary, K P, Thalmann, R, Banreti, E, Nurul, A, Fira, R, Yandayan, T, Chekirda, K, Bergmans, R & Lassila, A 2018, ' Angle comparison using an autocollimator ', Metrologia, vol. 55, no. 1A, 04001 . https://doi.org/10.1088/0026-1394/55/1A/04001
Autocollimators are versatile optical devices for the contactless measurement of the tilt angles of reflecting surfaces. An international key comparison (KC) on autocollimator calibration, EURAMET.L-K3.2009, was initiated by the European Association
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b5845743c99167ec8d00f7a4a653aadf
https://cris.vtt.fi/en/publications/b28a8aa0-b43f-47fe-a62a-34649e7c7f1d
https://cris.vtt.fi/en/publications/b28a8aa0-b43f-47fe-a62a-34649e7c7f1d
Autor:
C Motzkus, Oa Kruger, K Dirscherl, E Buhr, Fu We, Ichiko Misumi, Kayori Takahashi, Y Shi, Cs Kim, Kensei Ehara, Ma Lawn, Ak JAmting, L. Adlem, J Garnas, Toshiyuki Takatsuji, Sj Cho, J Damasceno, Sitian Gao, Kentaro Sugawara, Jan Herrmann, Va Coleman, Michael Krumrey, E Enrico, Hj Catchpoole, Hf Weng, Jcv de Oliveira, J Salas, Toshiyuki Fujimoto, Felix Meli, Harald Bosse, Jariya Buajarern, Satoshi Gonda, Hl Lin, Gian Bartolo Picotto, Keiji Takahata, H.-U. Danzebrink, J Liu
Publikováno v:
Metrologia. 56:04004
Nanoparticles with size in the range from 10 nm to 300 nm and from three different materials (Au 10 nm, Ag 20 nm, and PSL 30 nm, 100 nm and 300 nm) were used in this supplementary comparison. The selected nanoparticles meet the requirements of differ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7a29d41d6715b7c5765e804b30332c24
https://doi.org/10.1088/0026-1394/56/1a/04004
https://doi.org/10.1088/0026-1394/56/1a/04004
Publikováno v:
Proceedings of SPIE; 11/14/2019, Vol. 11343, p1-4, 4p
Publikováno v:
Proceedings of SPIE; 4/26/2019, Vol. 11053, p1-8, 8p
Publikováno v:
Measurement Science and Technology. 18:1735-1739
An atomic force microscope (AFM) head designed for nanometrology is accomplished in this study. It is the sensing component of the nano-measuring machine, a nanometrological instrument with a working range of 50 mm × 50 mm × 2 mm, as well as a part
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3f2d0e74b9fce75a7117e656b20a3cae
https://doi.org/10.1088/0957-0233/18/6/s11
https://doi.org/10.1088/0957-0233/18/6/s11
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20(6)
Atomic force microscopy (AFM) and laser scanning microscopy (LSM) measurements on a series of specially designed roughness artifacts were performed and the results characterized by spectral analysis. As demonstrated by comparisons, both AFM and LSM c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3380b7deec7cbb55d8bacef32e146dcc
https://pubmed.ncbi.nlm.nih.gov/25339140
https://pubmed.ncbi.nlm.nih.gov/25339140
Publikováno v:
SPIE Proceedings.
The surface roughness at micro/nano scale is essential in the quality of the optical surface. In quantitative characterization of the roughness surfaces, SPM instruments are widely used due to its ultra-high resolution and powerful performance. Howev
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::76d3329dc3a6c8b2b634ac5608fcba17
https://doi.org/10.1117/12.2072892
https://doi.org/10.1117/12.2072892
Autor:
Shu zhang, Yushu Shi, Sitian Gao, Lei Pi, Qi Li, Wei Li, Zhendong Zhu, Shi Li, Lu Huang, Xin Guo
Publikováno v:
Proceedings of SPIE; 1/20/2017, Vol. 10244, p1-7, 7p