Zobrazeno 1 - 10
of 34
pro vyhledávání: '"Sitian Gao"'
Publikováno v:
Computers & Chemical Engineering. 169:108086
Continuous distillation is an important separation process in chemical engineering curriculum. Conventionally, it is often taught as black box diagrams that lack user visibility, thus preventing students from developing a deeper understanding and com
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::06fe27500f9bfe62e8514b75cc391e62
https://doi.org/10.1016/j.compchemeng.2022.108086
https://doi.org/10.1016/j.compchemeng.2022.108086
Autor:
Sitian Gao, Xiaokang Wang, Song Xiaoping, Pengfei Zha, Axiang Jin, Zhang Airui, Wang Hai, Meiling Wang
Publikováno v:
Spectrochimica Acta Part B: Atomic Spectroscopy. 141:7-14
Quantitative determination of trace elements like S, Fe, Cu, Mn and Pb in gasoline and S in diesel is of great importance due to the growing concerns over air pollution, human health and engine failure caused by utilization of gasoline and diesel wit
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5e5554895771a544ffcde81cbfb713c3
https://doi.org/10.1016/j.sab.2017.12.009
https://doi.org/10.1016/j.sab.2017.12.009
Publikováno v:
Modern Physics Letters B. 35:2140011
In this study, a tracing method for a scanning electron microscope was developed based on a heterodyne interferometer, which can directly trace the measured values to the laser wavelength and then to the internationally defined meter length reference
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::32e7cdb82187d42a24b1460d03fab09b
https://doi.org/10.1142/s021798492140011x
https://doi.org/10.1142/s021798492140011x
Autor:
K P Chaudhary, T Watanabe, F. Saraiva, Andreas Just, Konstantin Chekirda, A Lewis, R Bergmans, T Anusorn, F Dvorácek, Antti Lassila, I Victorov, R Thalmann, A Nurul, E. Banreti, J Przybylska, A. Duta, Marco Pisani, J A Salgado, Ralf D. Geckeler, S L Tan, S Zelenika, Peter Cox, R. Fira, Tanfer Yandayan, E. Prieto, Vasilev, Sitian Gao
Publikováno v:
Geckeler, R D, Just, A, Vasilev, V, Prieto, E, Dvorácek, F, Zelenika, S, Przybylska, J, Duta, A, Victorov, I, Pisani, M, Saraiva, F, Salgado, J A, Gao, S, Anusorn, T, Tan, S L, Cox, P, Watanabe, T, Lewis, A, Chaudhary, K P, Thalmann, R, Banreti, E, Nurul, A, Fira, R, Yandayan, T, Chekirda, K, Bergmans, R & Lassila, A 2018, ' Angle comparison using an autocollimator ', Metrologia, vol. 55, no. 1A, 04001 . https://doi.org/10.1088/0026-1394/55/1A/04001
Autocollimators are versatile optical devices for the contactless measurement of the tilt angles of reflecting surfaces. An international key comparison (KC) on autocollimator calibration, EURAMET.L-K3.2009, was initiated by the European Association
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b5845743c99167ec8d00f7a4a653aadf
https://cris.vtt.fi/en/publications/b28a8aa0-b43f-47fe-a62a-34649e7c7f1d
https://cris.vtt.fi/en/publications/b28a8aa0-b43f-47fe-a62a-34649e7c7f1d
Autor:
C Motzkus, Oa Kruger, K Dirscherl, E Buhr, Fu We, Ichiko Misumi, Kayori Takahashi, Y Shi, Cs Kim, Kensei Ehara, Ma Lawn, Ak JAmting, L. Adlem, J Garnas, Toshiyuki Takatsuji, Sj Cho, J Damasceno, Sitian Gao, Kentaro Sugawara, Jan Herrmann, Va Coleman, Michael Krumrey, E Enrico, Hj Catchpoole, Hf Weng, Jcv de Oliveira, J Salas, Toshiyuki Fujimoto, Felix Meli, Harald Bosse, Jariya Buajarern, Satoshi Gonda, Hl Lin, Gian Bartolo Picotto, Keiji Takahata, H.-U. Danzebrink, J Liu
Publikováno v:
Metrologia. 56:04004
Nanoparticles with size in the range from 10 nm to 300 nm and from three different materials (Au 10 nm, Ag 20 nm, and PSL 30 nm, 100 nm and 300 nm) were used in this supplementary comparison. The selected nanoparticles meet the requirements of differ
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7a29d41d6715b7c5765e804b30332c24
https://doi.org/10.1088/0026-1394/56/1a/04004
https://doi.org/10.1088/0026-1394/56/1a/04004
Publikováno v:
Proceedings of SPIE; 11/14/2019, Vol. 11343, p1-4, 4p
Publikováno v:
Proceedings of SPIE; 4/26/2019, Vol. 11053, p1-8, 8p
Publikováno v:
Measurement Science and Technology. 18:1735-1739
An atomic force microscope (AFM) head designed for nanometrology is accomplished in this study. It is the sensing component of the nano-measuring machine, a nanometrological instrument with a working range of 50 mm × 50 mm × 2 mm, as well as a part
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3f2d0e74b9fce75a7117e656b20a3cae
https://doi.org/10.1088/0957-0233/18/6/s11
https://doi.org/10.1088/0957-0233/18/6/s11
Publikováno v:
2015 International Conference on Manipulation, Manufacturing and Measurement on the Nanoscale (3M-NANO).
One or more probes will be used in the system of AFM, this paper mainly expounds a special shape quartz tuning fork probe whose tip stick on two parallel forks symmetrically and construct a simple AFM system by using the probe, Nano-positioning, Lock
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::79a5b2be174a94501198871f065e209a
https://doi.org/10.1109/3m-nano.2015.7425491
https://doi.org/10.1109/3m-nano.2015.7425491
Publikováno v:
Microscopy and microanalysis : the official journal of Microscopy Society of America, Microbeam Analysis Society, Microscopical Society of Canada. 20(6)
Atomic force microscopy (AFM) and laser scanning microscopy (LSM) measurements on a series of specially designed roughness artifacts were performed and the results characterized by spectral analysis. As demonstrated by comparisons, both AFM and LSM c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3380b7deec7cbb55d8bacef32e146dcc
https://pubmed.ncbi.nlm.nih.gov/25339140
https://pubmed.ncbi.nlm.nih.gov/25339140