Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Sirish Boddikurapati"'
Autor:
Yiorgos Makris, Amit Nahar, Constantinos Xanthopoulos, Sirish Boddikurapati, Deepika Neethirajan
Publikováno v:
DATE
To combat the effects of process variation in modern, high-performance integrated Circuits (ICs), various post-manufacturing calibrations are typically performed. These calibrations aim to bring each device within its specification limits and ensure
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::0f451ac0061ac6ce561feea827e7a40c
https://doi.org/10.23919/date.2019.8715082
https://doi.org/10.23919/date.2019.8715082
Autor:
Constantinos Xanthopoulos, Sirish Boddikurapati, Ali Ahmadi, Bob Orr, Amit Nahar, Yiorgos Makris
Publikováno v:
ISCAS
Post silicon trimming is extensively used to counter the effects of manufacturing process variation on certain critical electrical parameters of an integrated circuit (IC). Usually, trimming is performed iteratively by adjusting the resistance value
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::952285f539aa57460c22448882b9ee06
https://doi.org/10.1109/iscas.2017.8050756
https://doi.org/10.1109/iscas.2017.8050756