Zobrazeno 1 - 10
of 13
pro vyhledávání: '"Siranush E, Bezirganyan"'
Publikováno v:
Journal of Applied Mathematics and Physics. :1731-1755
The grazing-incidence hard X-ray retro-reflector (GIRR) is a novel optical element, which completely suppresses the conventional mirror beam in the retro-reflection mode, and, at the same time, totally reflects the primary grazing incident X-radiatio
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::6206b6f370801f3f89764cebe23f6e2a
https://doi.org/10.4236/jamp.2016.49181
https://doi.org/10.4236/jamp.2016.49181
Publikováno v:
Optik - International Journal for Light and Electron Optics.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::037043ef1e63ee3ddb56ee3da5052547
https://doi.org/10.1016/j.ijleo.2016.09.121
https://doi.org/10.1016/j.ijleo.2016.09.121
Publikováno v:
Journal of Nanoscience and Nanotechnology. 7:306-315
Most important aspect of nanotechnology applications in the information ultrahigh storage is the miniaturization of data carrier elements of the storage media with emphasis on the long-term stability. Proposed two-dimensional ultrahigh-density X-ray
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fefa8069e42a610f15f2ecd0385a7d14
https://doi.org/10.1166/jnn.2007.18027
https://doi.org/10.1166/jnn.2007.18027
Autor:
Youri G. Mossikyan, Hakob P. Bezirganyan, Hayk H. Bezirganyan, Petros H. Bezirganyan, Siranush E. Bezirganyan
Publikováno v:
Journal of Optics A: Pure and Applied Optics. 7:604-612
An ultrahigh-density x-ray optical data storage medium useful for terabyte-scale memory applications and named X-ROM is proposed. The X-RO Mi sa nanocrystalline semiconductor layer, in which non-diffracting nanosized reflectors of x-radiation are emb
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fd13189a29d6cc5af7964ef2360f3071
https://doi.org/10.1088/1464-4258/7/10/013
https://doi.org/10.1088/1464-4258/7/10/013
Publikováno v:
Optics Communications. 238:13-28
Presented theoretical paper concerns the specular beam suppression and enhancement phenomena, which take place during the applications of the non-destructive and extremely sensitive Grazing-angle Incidence X-ray Backdiffraction (GIXB) technique for t
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::459ad871b12a2e3a7c115aeadf4c452c
https://doi.org/10.1016/j.optcom.2004.04.038
https://doi.org/10.1016/j.optcom.2004.04.038
Publikováno v:
Advances in X-Ray/EUV Optics and Components IV.
Paper is devoted to further evolution of the concept of ultra-high density hard x-ray storage media - a radically new x-ray- based optical data storage nanotechnology with terabit-scale digital data density per square centimeter of each storage layer
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bb974dc1018f554bf1ebc36f86cae721
https://doi.org/10.1117/12.826034
https://doi.org/10.1117/12.826034
Publikováno v:
SPIE Proceedings.
We present in this theoretical paper a set-up of grazing-angle incidence hard x-ray nanoscope (GIXN), which is the essential part of ultra-high density digital data read-out device. The GIXN consists of the asymmetrically cut single crystal, which is
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e0138d0920d7e55797edb8cbb27dd9cf
https://doi.org/10.1117/12.796346
https://doi.org/10.1117/12.796346
Publikováno v:
Brilliant Light in Life and Material Sciences ISBN: 9781402057229
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::b14fd6b05fa05b460c900158eef41616
https://doi.org/10.1007/978-1-4020-5724-3_50
https://doi.org/10.1007/978-1-4020-5724-3_50
Publikováno v:
Journal of nanoscience and nanotechnology. 7(1)
Most important aspect of nanotechnology applications in the information ultrahigh storage is the miniaturization of data carrier elements of the storage media with emphasis on the long-term stability. Proposed two-dimensional ultrahigh-density X-ray
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::d6b3f04ba09ff4e4aa1cbc664bc4e595
https://pubmed.ncbi.nlm.nih.gov/17455496
https://pubmed.ncbi.nlm.nih.gov/17455496
Publikováno v:
MRS Proceedings. 768
Presented theoretical paper concerns the structure investigation of Si/SiGe/Si heterojunction bipolar device by the extremely sensitive Grazing-angle Incidence X-ray Backdiffraction (GIXB) technique. The silicon cap layer and the silicon substrate ha
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::699dbff961a7c9f2f849b5cd1b11b942
https://doi.org/10.1557/proc-768-g3.1
https://doi.org/10.1557/proc-768-g3.1