Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Siou-Zih Lin"'
Autor:
Ping-Hung Wu, Thi Phuong Hoang, Yen-Ting Chou, Andres Philip Mayol, Yu-Wei Lai, Chih-Hsiang Kang, Yu-Cheng Chan, Siou-Zih Lin, Ssu-Han Chen
Publikováno v:
Mathematics, Vol 12, Iss 20, p 3164 (2024)
Integrated circuits (ICs) are critical components in the semiconductor industry, and precise wafer defect inspection is essential for maintaining product quality and yield. This study addresses the challenge of insufficient sample patterns in wafer d
Externí odkaz:
https://doaj.org/article/1bab8935e4e34af88556c5a9bd6c0347
Publikováno v:
Mathematics, Vol 12, Iss 15, p 2415 (2024)
With increasing wafer sizes and diversifying die patterns, automated optical inspection (AOI) is progressively replacing traditional visual inspection (VI) for wafer defect detection. Yet, the defect classification efficacy of current AOI systems in
Externí odkaz:
https://doaj.org/article/705c3169b938471caa773306cde27e00
Autor:
Siou-Zih Lin, 林秀姿
99
This study aims to compare the gap of technology fronts between the United States (U.S.) and the global nations in the smart grid field. Highly cited patents were collected from 2001/01/01 to 2010/12/31 and then were analyzed through bibliogr
This study aims to compare the gap of technology fronts between the United States (U.S.) and the global nations in the smart grid field. Highly cited patents were collected from 2001/01/01 to 2010/12/31 and then were analyzed through bibliogr
Externí odkaz:
http://ndltd.ncl.edu.tw/handle/32001426486560515949
Publikováno v:
Technological Forecasting and Social Change. 79:1705-1719
This study aims to propose a methodology that describes the technology fronts evolution and compares the temporal gaps between two specialties. Using the patent documents of a local country, the United States (US), as well as the global context in th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ae2ace09f1495ec71379dcfa0cb9d43e
https://doi.org/10.1016/j.techfore.2012.06.005
https://doi.org/10.1016/j.techfore.2012.06.005
Publikováno v:
IEEM
This study aims to compare the technology trajectories between the United States (U.S.) and the global nations in the smart grid field. Highly cited patents were collected from 2001/1/1 to 2010/12/31 and then were analyzed through bibliographic coupl
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0d5c33cc051ad1af27ecf5711ce6c531
https://doi.org/10.1109/ieem.2011.6118071
https://doi.org/10.1109/ieem.2011.6118071