Zobrazeno 1 - 10
of 20
pro vyhledávání: '"Siong Luong Ting"'
Autor:
Yanlin Pan, Krishnanunni Menon, Pik Kee Tan, Kyaw Htin, Hao Tan, Hnin Hnin Win Thoungh Ma, C. Q. Chen, Naiyun Xu, Siong Luong Ting
Publikováno v:
Advances in Science, Technology and Engineering Systems Journal. 6:52-61
Autor:
Siong Luong Ting, Pik Kee Tan, Moon SeungJe, Jerome Cuevas Alag, Yanlin Pan, Hnin Hnin, Tin Tin Yu, Kevin Kang, Alfred Quah, Changqing Chen
Publikováno v:
2022 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Publikováno v:
Advances in Science, Technology and Engineering Systems Journal. 5:1273-1281
Autor:
Naiyun Xu, D. Nagalingam, R. Fransiscus, Siong Luong Ting, Pik Kee Tan, A. C. T. Quah, Htin Kyaw, H. H. W. Thoungh, C. Q. Chen, Yanlin Pan, Krishnanunni Menon, P.T. Ng, S. M. Parab, Hao Tan
Publikováno v:
2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Autor:
Yanlin Pan, Siong Luong Ting, Hao Tan, Hnin Hnin Win Thoungh, C. Q. Chen, Pik Kee Tan, Krishnanunni Menon, Naiyun Xu, Htin Kyaw
Publikováno v:
2021 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Autor:
Siong Luong Ting, Pik Kee Tan, Hnin Hnin Win Thoungh, Krishnanunni Menon, Naiyun Xu, Yanlin Pan, Changqing Chen
Publikováno v:
Microelectronics Reliability. 135:114566
Autor:
S.Y. Thum, H.H.W. Thoungh, Pik Kee Tan, C. Q. Chen, F. Rivai, D. Nagalingam, T.T. Yu, P.T. Ng, S.J. Moon, Siong Luong Ting, S.P. Neo, Yanlin Pan
Publikováno v:
International Symposium for Testing and Failure Analysis.
Gate oxide breakdown has always been a critical reliability issue in Complementary Metal-Oxide-Silicon (CMOS) devices. Pinhole analysis is one of the commonly use failure analysis (FA) technique to analysis Gate oxide breakdown issue. However, in ord
Publikováno v:
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
Nowadays, physical failure analysis (PFA) technique of delayering by finger polishing is still widely used in FA labs, a method that is direct, simple, and flexible. However, with continuous technology scaling of semiconductor devices, conventional t
Autor:
Siong Luong Ting, A. C. T. Quah, Francis Rivai, Pik Kee Tan, I. Withana, P.T. Ng, Krishnanunni Menon
Publikováno v:
2020 IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA).
The continuous growth and advancements of semiconductor devices for automotive applications and internet-of-things drive the demand and scaling of embedded non-volatile memories (eNVM). Existing eNVM landscape in 40nm and 28nm advanced processes is d
Autor:
Siong Luong Ting
High performance electrochemical sensors are capable of detecting various biosignals and molecules from biological samples. Particularly, certain analytes with very low concentration within body fluids such as hydrogen peroxide, nitric oxide or heavy
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::8faa12783d31983fc1f224ba409e1e02
https://doi.org/10.32657/10356/62528
https://doi.org/10.32657/10356/62528