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Autor:
Single Hsu, Brian Lee, Jansen Chee, Tamba Gbondo-Tugbawa, Ethan Wang, Ya-Chieh Lai, Eason Lin, Aaron Gower-Hall
Publikováno v:
Design-Process-Technology Co-optimization for Manufacturability XIV.
As we move to more advanced nodes, the number of Chemical Mechanical Polishing (CMP) steps in semiconductor processing is increasing rapidly. CMP is known to suffer from pattern dependent variation such as dishing, erosion, recess, etc., all of which
Publikováno v:
ECS Meeting Abstracts. :1470-1470
not Available.