Zobrazeno 1 - 10
of 187
pro vyhledávání: '"Simone Gerardin"'
Autor:
Simone Gerardin, Stefano Bonaldo, Christian Enz, Alessandro Paccagnella, Andrea Baschirotto, Teng Ma, Serena Mattiazzo
Publikováno v:
IEEE Transactions on Nuclear Science. 69:307-313
This article investigates the fin- and finger-number dependence of the total ionizing dose (TID) degradation in 16-nm bulk Si FinFETs at ultrahigh doses. n- and p-FinFETs designed with different numbers of fins and fingers are irradiated up to 500 Mr
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d5fcdfafb21b8726048f301fb1135b3d
https://doi.org/10.1109/tns.2021.3125769
https://doi.org/10.1109/tns.2021.3125769
Autor:
Stefano Bonaldo, Serena Mattiazzo, Marta Bagatin, Alessandro Paccagnella, Giovanni Margutti, Simone Gerardin
Publikováno v:
Electronics
Volume 12
Issue 3
Pages: 543
Volume 12
Issue 3
Pages: 543
The total ionizing dose sensitivity of planar 150 nm CMOS technology is evaluated by measuring the DC responses of nMOSFETs at several irradiation steps up to 125 krad(SiO2). Different TID sensitivities are measured for transistors built with differe
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::c00635bcbaae8916372d97a6ff3a91e6
https://hdl.handle.net/11577/3469069
https://hdl.handle.net/11577/3469069
Publikováno v:
IEEE Transactions on Emerging Topics in Computing. 9:104-108
The very limited availability of fast neutron facilities, particularly in Europe, for testing of microelectronics has motivated the construction of ChipIr, a new beamline at the ISIS neutron and muon source in the UK. ChipIr has been designed for Sin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::0a5043b6af20839a736981e23d797754
https://doi.org/10.1109/tetc.2018.2879027
https://doi.org/10.1109/tetc.2018.2879027
Autor:
Luigi Salvatore Esposito, Giuseppe Lerner, Maris Tali, Alessandro Paccagnella, Oliver Stein, Salvatore Danzeca, Kacper Bilko, Matteo Cecchetto, Carlo Cazzaniga, Simone Gerardin, Yacine Kadi, Cristina Bahamonde Castro, Frédéric Wrobel, Ruben Garcia Alia, M. Brucoli, Marta Bagatin
Publikováno v:
IEEE Transactions on Nuclear Science
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2020, 67 (7), pp.1412-1420. ⟨10.1109/TNS.2020.2997992⟩
IEEE Transactions on Nuclear Science, Institute of Electrical and Electronics Engineers, 2020, 67 (7), pp.1412-1420. ⟨10.1109/TNS.2020.2997992⟩
International audience; In addition to high-energy hadrons, which include neutrons, protons, and pions above 20 MeV, thermal neutrons (ThNs) are a major concern in terms of soft error rate (SER) for electronics operating in the large hadron collider
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d32857d7aeb002f65b77da7fed109f72
https://doi.org/10.1109/tns.2020.2997992
https://doi.org/10.1109/tns.2020.2997992
Autor:
Simone Gerardin, Stefano Bonaldo, Dimitri Linten, Robert A. Reed, Ronald D. Schrimpf, Bertrand Parvais, Daniel M. Fleetwood, Simeng E. Zhao, En Xia Zhang, V. Putcha, Alessandro Paccagnella
Publikováno v:
IEEE Transactions on Nuclear Science. 67:1312-1319
The total-ionizing-dose (TID) response of indium gallium arsenide (InGaAs) MOSFETs with Al2O3 gate dielectrics and several channel lengths is evaluated under different biases. DC static characteristics show large negative threshold voltage $V_{\text
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::3bb9fd83be0c26960cd546327d96c81c
https://doi.org/10.1109/tns.2019.2963340
https://doi.org/10.1109/tns.2019.2963340
Autor:
Christian Poivey, Alessandra Costantino, Christopher D. Frost, Simone Gerardin, S. Beltrami, Alessandro Paccagnella, Carlo Cazzaniga, Giovanni Santin, Marta Bagatin, Veronique Ferlet-Cavrois
Publikováno v:
IEEE Transactions on Nuclear Science. 67:154-160
The feasibility of a 3-D-NAND-Flash-based heavy-ion detector is explored. The possibility of measuring the angle of incidence and the linear energy transfer (LET) of impinging particles by studying the pattern of the threshold voltage shifts along th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::745852595ff89b90f8c1633e54fb2edb
https://doi.org/10.1109/tns.2019.2955776
https://doi.org/10.1109/tns.2019.2955776
Autor:
Stefano Bonaldo, Teng Ma, Serena Mattiazzo, Andrea Baschirotto, Christian Enz, Daniel M. Fleetwood, Alessandro Paccagnella, Simone Gerardin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d795791efe10591159744e576ab1e859
https://hdl.handle.net/11577/3450089
https://hdl.handle.net/11577/3450089
Autor:
Stefano Bonaldo, En Xia Zhang, Serena Mattiazzo, Alessandro Paccagnella, Simone Gerardin, Ronald D. Schrimpf, Daniel M. Fleetwood
Publikováno v:
IEEE Transactions on Nuclear Science. :1-1
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::b70180ae6861bd009d51b09a5275cee5
https://doi.org/10.1109/tns.2023.3237179
https://doi.org/10.1109/tns.2023.3237179
Autor:
Michael Wind, Christoph Tscherne, Marta Bagatin, Simone Gerardin, Lukas Huber, Marcin Latocha, Alessandro Paccagnella, Marc Poizat, Peter Beck
Publikováno v:
2021 21th European Conference on Radiation and Its Effects on Components and Systems (RADECS).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5dbc1cc38b2fa1d76590b34de32cdd32
https://doi.org/10.1109/radecs53308.2021.9954531
https://doi.org/10.1109/radecs53308.2021.9954531