Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Simona Pappalardo"'
Publikováno v:
2nd Asia Symposium on Quality Electronic Design (ASQED).
In this paper we propose an integrated method for effective failure analysis at device package level. For this reason, some well-known techniques will be reviewed and some new methodologies proposed, in the effort of building an organic flow, able to