Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Simon Noever"'
Publikováno v:
AIMS Materials Science, Vol 2, Iss 4, Pp 369-378 (2015)
Tailoring device architecture and active film morphology is crucial for improving organic electronic devices. Therefore, knowledge about the local degree of crystallinity is indispensable to gain full control over device behavior and performance. In
Externí odkaz:
https://doaj.org/article/3bdcbb7b29ad40b686d860243d3d238a
