Zobrazeno 1 - 10
of 41
pro vyhledávání: '"Simon J. Bale"'
Publikováno v:
IET Computers & Digital Techniques, Vol 17, Iss 3-4, Pp 180-194 (2023)
Abstract Modern electronic design automation (EDA) tools can handle the complexity of state‐of‐the‐art electronic systems by decomposing them into smaller blocks or cells, introducing different levels of abstraction and staged design flows. How
Externí odkaz:
https://doaj.org/article/7f6aeb0eaecd4d49b22e8b0117bd3332
Autor:
Andrew C. Marvin, Simon J. Bale
Publikováno v:
IEEE Transactions on Electromagnetic Compatibility. 64:893-896
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::cb32dfd16ac79b1847aee755a6c1975b
https://doi.org/10.1109/temc.2022.3142937
https://doi.org/10.1109/temc.2022.3142937
Autor:
Andrew C. Marvin, Simon J. Bale
Publikováno v:
2022 International Symposium on Electromagnetic Compatibility – EMC Europe.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::096623afba0e8beba6fa52fe76944479
https://doi.org/10.1109/emceurope51680.2022.9901280
https://doi.org/10.1109/emceurope51680.2022.9901280
Publikováno v:
2022 International Joint Conference on Neural Networks (IJCNN).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::353c24d8e94732c4c1d590eb02b2ae75
https://doi.org/10.1109/ijcnn55064.2022.9892201
https://doi.org/10.1109/ijcnn55064.2022.9892201
Publikováno v:
2021 IEEE Symposium Series on Computational Intelligence (SSCI).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a9dbb961e2709857d79ef80ebb98b196
https://doi.org/10.1109/ssci50451.2021.9659887
https://doi.org/10.1109/ssci50451.2021.9659887
Autor:
Andy Marvin, Stuart J. Porter, Simon J. Bale, Martin Robinson, Richard Hoad, Barney Petit, L. Dawson, Tim Rees, Mark Hough, Iain Will, John F. Dawson
Publikováno v:
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium.
A resonant dipole antenna for testing immunity of equipment to intentional electromagnetic interference (IEMI) is described, along with simulated and measured test results which are in good agreement and demonstrate the high voltage operation.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::490188c995cc37d52e19705892bd7139
https://doi.org/10.1109/emc/si/pi/emceurope52599.2021.9559166
https://doi.org/10.1109/emc/si/pi/emceurope52599.2021.9559166
Autor:
Andy Marvin, John F. Dawson, Iain Will, L. Dawson, Mark Hough, Barney Petit, Tim Rees, Simon J. Bale, Richard Hoad, Martin Robinson
Publikováno v:
2021 IEEE International Joint EMC/SI/PI and EMC Europe Symposium.
A robust lightweight antenna for testing immunity of equipment to intentional electromagnetic interference (IEMI), based on a planar Vivaldi design, is described, along with simulated and measured test results.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fa2829609b2007e6496e7e9727369b80
https://doi.org/10.1109/emc/si/pi/emceurope52599.2021.9559333
https://doi.org/10.1109/emc/si/pi/emceurope52599.2021.9559333
To tackle the complexity of state-of-the-art electronic systems, silicon foundries continuously shrink the technology nodes and electronic design automation (EDA) vendors offer hierarchical design flows to decompose systems into smaller blocks. Howev
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f6f1a12a330ef91bab58659df7b7115c
http://arxiv.org/abs/2105.11248
http://arxiv.org/abs/2105.11248
Publikováno v:
ReCoSoC
Convolutional Neural Networks (CNNs) have been widely used in many computer applications. The growth in deep neural networks and machine learning applications has resulted in the state-of-the-art in CNN architectures becoming more and more complex. M
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5db749574f8f41f5c36ca4bbac6d9f76
https://doi.org/10.1109/recosoc48741.2019.9034956
https://doi.org/10.1109/recosoc48741.2019.9034956
Publikováno v:
IEEE Transactions on Electromagnetic Compatibility. 58:553-560
Absorption by the contents of an equipment enclosure, particularly printed circuit boards (PCBs), affect the enclosure's shielding performance. At high frequencies, this absorption can be quantified using the angle of arrival and polarization average
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::29ae1cfd9f44cc2f3dd08f24ffbecdc2
https://doi.org/10.1109/temc.2016.2515658
https://doi.org/10.1109/temc.2016.2515658