Zobrazeno 1 - 9
of 9
pro vyhledávání: '"Simon Hutton"'
Autor:
Robert K. Heaton, Chiara Ceresa, Marta Lajarin-Cuesta, Simon Hutton, Letizia Fracchia, Mayri A. Díaz De Rienzo, Iain P. Hargreaves
Publikováno v:
Current Microbiology
Antimicrobial resistance (AMR) is a current major health issue, both for the high rates of resistance observed in bacteria that cause common infections and for the complexity of the consequences of AMR. Pathogens like Staphylococcus aureus, Pseudomon
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::9f0dbe6d5b6d4cb14f529c066f3b8a13
https://doi.org/10.1007/s00284-020-01927-2
https://doi.org/10.1007/s00284-020-01927-2
Publikováno v:
Microscopy and Microanalysis. 27:3448-3448
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::c03745c49bde385bd9d5a1ab13f9b7a7
https://doi.org/10.1017/s1431927621011855
https://doi.org/10.1017/s1431927621011855
Autor:
Adam Roberts, Marek Szklarczyk, Karol Macak, K. Takahashi, Rafał Głaszczka, Christopher Blomfield, Simon Hutton
Publikováno v:
Applied Surface Science. 411:386-393
The development of a method capable of distinguishing a single atom in a single molecule is important in many fields. The results reported herein demonstrate sub-nanometer resolution for angularly resolved X-ray photoelectron spectroscopy (ARXPS). Th
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e4e54f5be162c64c86852778413f4b70
https://doi.org/10.1016/j.apsusc.2017.02.222
https://doi.org/10.1016/j.apsusc.2017.02.222
Publikováno v:
The Journal of Physical Chemistry C. 120:25317-25327
We present experimental data on the angular distribution of Irganox 1010 organic molecules sputtered by large argon gas cluster projectiles (E/n = 5 eV, 10 keV Ar2000). Ejection probability distributions as derived from deposit patterns on planar col
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::19ef0998268dc9fb7818dbe440aa0d6d
https://doi.org/10.1021/acs.jpcc.6b06821
https://doi.org/10.1021/acs.jpcc.6b06821
Autor:
Shanaka de Silva, Simon Hutton, Chris Russo, Brian A. Haley, Opal Otenburg, Lorelei M. Hayden, Charles T. Lewis, Deron T. Carter
Publikováno v:
Geological Society of America Abstracts with Programs.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::3402eef637ca4d3b880e8486f5ced584
https://doi.org/10.1130/abs/2018am-323905
https://doi.org/10.1130/abs/2018am-323905
Publikováno v:
Measurement. 43:1299-1304
The estimation of transmission efficiency was done on an Axis Ultra electron spectrometer according to the parameters presented in the literatures. At the same time, Ag, Au, and Cu were measured as standard sample to check the real transmission effic
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::d2bb373adde4e22ee43f329aac7ac92c
https://doi.org/10.1016/j.measurement.2010.07.007
https://doi.org/10.1016/j.measurement.2010.07.007
Autor:
Karim Benzarti, Simon Hutton, Mohamed M. Chehimi, Victor Oliva, Carole Connan, Bechir Mrabet, Maria Inês Baeta Neves, Adam Roberts, Michel Delamar
Publikováno v:
Surface and Interface Analysis. 33:834-841
Two cement pastes commonly used in concrete formulations were characterized by XPS before and after coating with an epoxy resin and a hardener. The XPS allowed the surface chemistry change induced by the organic coating to be monitored. In particular
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a220b2971be94d9bdb44650487994f27
https://doi.org/10.1002/sia.1461
https://doi.org/10.1002/sia.1461
Autor:
Ryosuke Ogaki, Morgan R. Alexander, J. L. S. Lee, Alexander G. Shard, Ali Rafati, Simon Hutton, Gautam Mishra, Martyn C. Davies
Publikováno v:
Shard, A G, Lee, J L S, Rafati, A, Davies, M C, Alexander, M R, Hutton, S, Mishra, G & Ogaki, R 2009, ' Organic depth profiling of a binary system : The compositional effect on secondary ion yield and a model for charge transfer during secondary Ion emission ', Journal of Physical Chemistry Part B: Condensed Matter, Materials, Surfaces, Interfaces & Biophysical, vol. 113, no. 34, pp. 11574-11582 . https://doi.org/10.1021/jp904911n
In recent years, it has been demonstrated that cluster ion beams may be used to sputter some materials, particularly organic materials, without the significant accumulation of damage. It is therefore possible to use cluster ion beam sputtering in con
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::d040c15c004a95bc0cae8a712c6d2172
https://pure.au.dk/portal/da/publications/organic-depth-profiling-of-a-binary-system(a0c9bbf6-ea75-4b20-bc4b-24389d0af2b5).html
https://pure.au.dk/portal/da/publications/organic-depth-profiling-of-a-binary-system(a0c9bbf6-ea75-4b20-bc4b-24389d0af2b5).html
Autor:
Adam Roberts, Robert D. Short, Stuart Fraser, Simon Hutton, Pat N. Brookes, Erick R. Fuoco, Luke Hanley
Thin polymer films have been grown from hyperthermal [m/z 147, Si2OMe5+] ions, using ion energies of 15, 25, 50, and 100 eV. X-ray photoelectron spectroscopy (XPS) and secondary ion mass spectrometry (SIMS) analyses were undertaken of the air-aged po
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::7b7872de5a312ffbfb822d95c60ae7e1
https://hdl.handle.net/1959.8/45050
https://hdl.handle.net/1959.8/45050