Zobrazeno 1 - 10
of 67
pro vyhledávání: '"Simon Edler"'
Autor:
Andreas Schels, Florian Herdl, Matthias Hausladen, Dominik Wohlfartsstätter, Simon Edler, Michael Bachmann, Andreas Pahlke, Rupert Schreiner, Walter Hansch
Publikováno v:
Micromachines, Vol 14, Iss 11, p 2008 (2023)
Field emitter arrays (FEAs) are a promising component for novel vacuum micro- and nanoelectronic devices, such as microwave power amplifiers or fast-switching X-ray sources. However, the interrelated mechanisms responsible for FEA degradation and fai
Externí odkaz:
https://doaj.org/article/df3428d131fd4b6bbec6e46233f1e725
Autor:
Michael Bachmann, Matthias Hausladen, Philipp Buchner, Rupert Schreiner, Simon Edler, Vitali Bomke
Publikováno v:
2021 34th International Vacuum Nanoelectronics Conference (IVNC).
Four individually controllable emission tips consisting of p-Type silicon, were structured on a glass substrate by laser ablation. A matching extraction grid was manufactured in the same manner and aligned with the emitters. The resulting samples wer
Autor:
Manuel Meyer, Walter Hansch, Florian Herdl, Felix Düsberg, Magdalena Eder, Simon Edler, Andreas Schels, Markus Dudeck, Andreas Pahlke, Rupert Schreiner, Michael Bachmann, Dominik Wohlfartsstatter
Publikováno v:
2021 34th International Vacuum Nanoelectronics Conference (IVNC).
A current dependent performance test for comparison of different field emitter arrays is introduced. Statistical analysis is enabled due to a short measurement time and as a main feature the electric field shift, comparable to the degradation of the
Autor:
Michael Bachmann, Rupert Schreiner, Manuel Meyer, M. Dudek, Andreas Pahlke, Walter Hansch, Andreas Schels, Florian Herdl, Felix Düsberg, M. Eder, Simon Edler
Publikováno v:
2021 34th International Vacuum Nanoelectronics Conference (IVNC).
A current dependent performance test is used to investigate the influence of doping and emitter geometry on the lifetime of silicon field emitter arrays. The measurements reveal an improved performance for lower n-type dopant concentrations. Furtherm
Autor:
Christoph Langer, Josef Biba, Andreas Pahlke, Walter Hansch, Marinus Werber, Simon Edler, Felix Düsberg, Andreas Schels, Michael Bachmann
Publikováno v:
2020 33rd International Vacuum Nanoelectronics Conference (IVNC).
A novel silicon field emission source is presented, which is fabricated by saw dicing and TMAH-etching. Samples with different tip densities were investigated. Due to the fabrication process a higher tip density leads to a lower tip height. Very simi
Autor:
Michael Bachmann, Felix Düsberg, Andreas Pahlke, Simon Edler, Andreas Schels, Florian Herdl, Robert Ławrowski, Rupert Schreiner
Publikováno v:
Journal of Vacuum Science & Technology B. 40:010605
Autor:
Andreas Schels, Simon Edler, Florian Herdl, Walter Hansch, Michael Bachmann, Daniela Ritter, Markus Dudeck, Felix Düsberg, Manuel Meyer, Andreas Pahlke, Matthias Hausladen, Philipp Buchner, Rupert Schreiner
Publikováno v:
Journal of Vacuum Science & Technology B. 40:014202
Autor:
Simon Edler, E. Bunert, Stefan Zimmermann, R. Lawrowski, Christoph Langer, Rupert Schreiner, M. Hausladen, Felix Düsberg, Michael Bachmann, C. Wendt
Publikováno v:
Tagungsband.
Autor:
Andreas Schels, Andreas Pahlke, Manuel Meyer, Josef Biba, Felix Düsberg, Simon Edler, David von Bergen, Marinus Werber, Walter Hansch, Christoph Langer, Michael Bachmann
Publikováno v:
Journal of Vacuum Science & Technology B. 39:027001
Autor:
Manuel Meyer, David von Bergen, Marinus Werber, Andreas Schels, Felix Düsberg, Simon Edler, Walter Hansch, Andreas Pahlke, Christoph Langer, Josef Biba, Michael Bachmann
Publikováno v:
Journal of Vacuum Science & Technology B. 39:013205
Silicon field emitter arrays (FEAs) with different tip sizes and quantities were fabricated by saw dicing and anisotropic wet chemical etching by tetramethylammonium hydroxide. The tip is formed by the different etching rates of the crystal facets le