Zobrazeno 1 - 10
of 19
pro vyhledávání: '"Simevski, Aleksandar"'
Autor:
Andjelkovic, Marko, Chen, Junchao, Simevski, Aleksandar, Stamenkovic, Zoran, Krstic, Milos, Kraemer, Rolf
The soft error rate (SER) of integrated circuits (ICs) operating in space environment may vary by several orders of magnitude due to the variable intensity of radiation exposure. To ensure the radiation hardness without compromising the system perfor
Externí odkaz:
http://arxiv.org/abs/2104.01206
Autor:
Andjelkovic, Marko, Chen, Junchao, Simevski, Aleksandar, Schrape, Oliver, Krstic, Milos, Kraemer, Rolf
This work investigates the use of pulse stretching inverters for monitoring the variation of flux and Linear Energy Transfer (LET) of energetic particles. The basic particle detector consists of two cascaded pulse stretching (skew-sized) inverters de
Externí odkaz:
http://arxiv.org/abs/2104.01202
Autor:
Andjelkovic, Marko, Simevski, Aleksandar, Chen, Junchao, Schrape, Oliver, Stamenkovic, Zoran, Krstic, Milos, Ilic, Stefan, Ristic, Goran, Jaksic, Aleksandar, Vasovic, Nikola, Duane, Russell, Palma, Alberto J., Lallena, Antonio M., Carvajal, Miguel A.
Publikováno v:
In Microprocessors and Microsystems April 2022 90
Autor:
Hadzieva, Elena, Simevski, Aleksandar
Almost all dependable systems use some form of redundancy in order to increase fault-tolerance. Very popular are the $N$-Modular Redundant (NMR) systems in which a majority voter chooses the voting output. However, elaborate systems require fault-tol
Externí odkaz:
http://arxiv.org/abs/1504.05692
Akademický článek
Tento výsledek nelze pro nepřihlášené uživatele zobrazit.
K zobrazení výsledku je třeba se přihlásit.
K zobrazení výsledku je třeba se přihlásit.
Autor:
Andjelkovic, Marko, Chen, Junchao, Simevski, Aleksandar, Schrape, Oliver, Krstic, Milos, Kraemer, Rolf
Publikováno v:
IEEE Transactions on Nuclear Science; Aug2021, Vol. 68 Issue 8, p1772-1781, 10p
Autor:
Simevski, Aleksandar
Despite the numerous benefits that Integrated Circuit (IC) technology downscaling brings, it also introduces many challenges. First of all, IC dependability is lowering: both lifetime reliability and resilience to single event effects is decreasing.
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=od______3456::2a1d949a3395c40ca389e3a0d57ee1fe
https://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/3257
https://opus4.kobv.de/opus4-btu/frontdoor/index/index/docId/3257
Autor:
Simevski, Aleksandar, Schleisiek, Klaus, Petrovic, Vladimir, Beller, Norbert, Skoncej, Patryk, Schoof, Gunter, Krstic, Milos
Publikováno v:
2016 IEEE 19th International Symposium on Design & Diagnostics of Electronic Circuits & Systems (DDECS); 2016, p1-6, 6p
Publikováno v:
2014 NASA/ESA Conference on Adaptive Hardware & Systems (AHS); 2014, p233-239, 7p
Publikováno v:
2014 IEEE 8th International Symposium on Embedded Multicore/Manycore SoCs; 2014, p175-180, 6p