Zobrazeno 1 - 1
of 1
pro vyhledávání: '"Sim Y. Loo"'
Autor:
Nazmul Habib, Anda Mocuta, Xiaojun Yu, Susan K. Lichtensteiger, Ken Rim, Paul Chang, Kevin K. Dezfulian, Jeanne P. Bickford, Jie Deng, Sim Y. Loo
Publikováno v:
2012 Symposium on VLSI Technology (VLSIT).
A systematic method is proposed to address modeling challenges in accurate chip level leakage prediction, namely a precise total leakage width count method, a simple model to quantify leakage uplift caused by systematic across-chip variation, and a c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::eb093342ad7b11cd38af1f0f62da9b5b
https://doi.org/10.1109/vlsit.2012.6242526
https://doi.org/10.1109/vlsit.2012.6242526
