Zobrazeno 1 - 10
of 30
pro vyhledávání: '"Simón Roa"'
Autor:
Simón Roa, Martín Sirena
Publikováno v:
Instrumentation Science & Technology. 50:456-463
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::fb92974823fefbb44f9c32d8ad63a24d
https://doi.org/10.1080/10739149.2021.2023820
https://doi.org/10.1080/10739149.2021.2023820
Publikováno v:
Surfaces and Interfaces. 39:102948
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::712fd97aafd7279f11d00fcbd143aeab
https://doi.org/10.1016/j.surfin.2023.102948
https://doi.org/10.1016/j.surfin.2023.102948
Autor:
Simón Roa, María José Cortes Burgos
Publikováno v:
Materials Letters. 336:133863
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::bf0fdbd8f4198445a9a314641247f9cf
https://doi.org/10.1016/j.matlet.2023.133863
https://doi.org/10.1016/j.matlet.2023.133863
Autor:
Simón Roa, Martin Sirena
Publikováno v:
Journal of Materials Research. 36:938-948
We report a systematic study about the thickness and microstructure influence on the mechanical properties of nanocrystalline Cu thin films grown by DC sputtering. Mechanical properties were determined by using atomic force microscopy-assisted nanoin
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::153a8ff0273473e8fa858dbcc9ecb346
https://doi.org/10.1557/s43578-021-00147-z
https://doi.org/10.1557/s43578-021-00147-z
Publikováno v:
Solid State Communications. 361:115071
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::785cad818111561863d9806438b028b5
https://doi.org/10.1016/j.ssc.2023.115071
https://doi.org/10.1016/j.ssc.2023.115071
Publikováno v:
Chemical Physics Letters. 805:139951
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::572153e6781e62b0c67bec8db4891e87
https://doi.org/10.1016/j.cplett.2022.139951
https://doi.org/10.1016/j.cplett.2022.139951
Publikováno v:
Materials Today: Proceedings. 14:113-116
We study the mechanical properties of Cu thin films on Si (100) by performing nano-indentation using an atomic force microscopy. Cu films with thickness of 0.3 µm, 1 µm and 2 µm were analyzed. Area profile studies let us understand the critical in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::ba302b648b8d28f8065f491f9c5dec5d
https://doi.org/10.1016/j.matpr.2019.05.065
https://doi.org/10.1016/j.matpr.2019.05.065