Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Silva de Vasconcellos, Douglas"'
Autor:
Silva de Vasconcellos, Douglas, Bourrier, David, Imbernon, Eric, Hajdu, Kata, He, Yingning, Leïchlé, Thierry
Publikováno v:
In Sensors and Actuators: A. Physical 16 October 2024 377
Autor:
Silva de Vasconcellos, Douglas, Dailleau, Romain, Grimal, Virginie, Defforge, Thomas, Billoue, Jérôme, Gautier, Gaël
Publikováno v:
In Materials Science in Semiconductor Processing 15 March 2023 156
Autor:
Allanic, Rozenn, Le Borgne, Fabien, Bouazzaoui, Hassan, Le Berre, Denis, Quendo, Cédric, Silva De Vasconcellos, Douglas, Grimal, Virginie, Valente, Damien, Billoué, Jérôme
Publikováno v:
Electronics (2079-9292); Oct2022, Vol. 11 Issue 20, p3420-N.PAG, 13p
Publikováno v:
Micro and nanotechnologies/Microelectronics. Université Paul Sabatier-Toulouse III, 2020. English. ⟨NNT : 2020TOU30257⟩
Micro and nanotechnologies/Microelectronics. Université Toulouse 3 Paul Sabatier (UT3 Paul Sabatier), 2020. English
Micro and nanotechnologies/Microelectronics. Université Toulouse 3 Paul Sabatier (UT3 Paul Sabatier), 2020. English
National audience; The leading cause of mortality worldwide is due to undiagnosed treatable diseases. The underlying reason is the cost and complexity of most diagnostic processes, as they are often carried out in medical centers and require expensiv
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::3ccc695bc81de2e9a402fa5f24a2659a
https://hal.laas.fr/tel-03131243v2/document
https://hal.laas.fr/tel-03131243v2/document
Autor:
He, Yingning, Silva de Vasconcellos, Douglas, Bardinal, Véronique, Bourrier, David, Imbernon, Éric, Dollat, Xavier, Leichle, Thierry
Publikováno v:
Porous Semiconductors Science and Technology (PSST) Conference
Porous Semiconductors Science and Technology (PSST) Conference, Mar 2018, La Grande Motte, France
Porous Semiconductors Science and Technology (PSST) Conference, Mar 2018, La Grande Motte, France
International audience; We demonstrate the transducing ability of lateral porous silicon membranes (LPSi) using optical interferometry. To this aim, we use a Fourier Transform Infra-Red spectrometer (FTIR) coupled to a microscope stage equipped with
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=dedup_wf_001::8d901201e5cfcc777d4abeb803ef151c
https://hal.science/hal-03212768v2/file/PSST2018_He.pdf
https://hal.science/hal-03212768v2/file/PSST2018_He.pdf