Zobrazeno 1 - 10
of 40
pro vyhledávání: '"Sijung Yoo"'
Autor:
Seung-Min Chung, Hyung Keun Kim, Taeyoon Lee, Minkyu Lee, Seok Man Hong, Sijung Yoo, Myoungsub Kim, Youngjun Kim, Tae-Hoon Kim, Hyungjun Kim
Publikováno v:
Journal of Materials Chemistry C. 9:6006-6013
Three-dimensional (3D) cross-point (X-point) technology, including amorphous chalcogenide-based ovonic threshold switching (OTS) selectors, is bringing new changes to the memory hierarchy for high-performance computing systems. To prepare for future
Autor:
Sijung Yoo, Donghoon Kim, Yoon Mo Koo, Sujee Kim Wooju Jeong, Hyungjoon Shim, Won-Jun Lee, Beom Seok Lee, Seungyun Lee, Hyejung Choi, Hyung Dong Lee, Taehoon Kim, Myung-Hee Na
Publikováno v:
2022 IEEE International Memory Workshop (IMW).
Publikováno v:
IEEE Transactions on Electron Devices. 67:1454-1459
We developed an electro-thermal model for cross-point phase-change memory (X-PCM) and compared the calculation values with the experimental results. In order to simulate the electro-thermal phenomenon such as thermal disturbance (TDB) of victim cells
Autor:
Felix Cüppers, Rainer Waser, Sijung Yoo, Cheol Seong Hwang, Carsten Funck, Dirk J. Wouters, Stephan Menzel, Susanne Hoffmann-Eifert, Hehe Zhang
Publikováno v:
ACS Applied Materials & Interfaces. 10:29766-29778
Redox-type resistive random access memories based on transition-metal oxides are studied as adjustable two-terminal devices for integrated network applications beyond von Neumann computing. The pre...
Publikováno v:
Journal of Materials Chemistry C. 6:5025-5032
Ge–Sb–Se–Te (GSST) quaternary films were prepared through atomic layer deposition (ALD) to ensure their amorphous stability for ovonic threshold switching (OTS) applications. Se, a typical phase-change material, was incorporated into Ge–Sb–
Autor:
Cheol Seong Hwang, Chanyoung Yoo, Sergei A. Ivanov, Sang Gyun Kim, Taehong Gwon, Eui-Sang Park, Taeyong Eom, Moo-Sung Kim, Manchao Xiao, Sijung Yoo, Iain Buchanan
Publikováno v:
Chemistry of Materials. 29:8065-8072
In this paper, a new atomic layer deposition (ALD) process for depositing binary GeTe and ternary Ge–Sb–Te thin films is reported, where HGeCl3 and ((CH3)3Si)2Te were used as Ge and Te precursors, respectively. The precursors reacted together to
Autor:
Sijung Yoo, Manchao Xiao, Sergei Vladimirovich Ivanov, Deok-Yong Cho, Iain Buchanan, Cheol Seong Hwang, Taehong Gwon, Taeyong Eom, Moo-Sung Kim, Han-Koo Lee
Publikováno v:
Chemistry of Materials. 28:7158-7166
In this report, a new method to deposit GeTe thin film by atomic layer deposition (ALD) is described. Ge(N(Si(CH3)3)2)2, in which Ge is in +2 oxidation state, and ((CH3)3Si)2Te were used as Ge and Te precursors, respectively. GeTe films were deposite
Publikováno v:
ACS Photonics. 3:1265-1270
The multilayered optical coating whose structure consists of optical cavity and multiple layers of ultrathin phase change material (PCM) film is presented. The color changing is enabled via transition between amorphous and crystalline phases of PCM,
Autor:
Hehe, Zhang, Sijung, Yoo, Stephan, Menzel, Carsten, Funck, Felix, Cüppers, Dirk J, Wouters, Cheol Seong, Hwang, Rainer, Waser, Susanne, Hoffmann-Eifert
Publikováno v:
ACS applied materialsinterfaces. 10(35)
Redox-type resistive random access memories based on transition-metal oxides are studied as adjustable two-terminal devices for integrated network applications beyond von Neumann computing. The prevailing, so-called, counter-eight-wise (c8w) polarity
Autor:
Woohyun, Kim, Sijung, Yoo, Chanyoung, Yoo, Eui-Sang, Park, Jeongwoo, Jeon, Young Jae, Kwon, Kyung Seok, Woo, Han Joon, Kim, Yoon Kyeung, Lee, Cheol Seong, Hwang
Publikováno v:
Nanotechnology. 29(36)
The ovonic threshold switch (OTS) based on the voltage snapback of amorphous chalcogenides possesses several desirable characteristics: bidirectional switching, a controllable threshold voltage (V