Zobrazeno 1 - 10
of 812
pro vyhledávání: '"Signal edge"'
Publikováno v:
IEEE Transactions on Industrial Electronics. 69:8839-8850
Finite control-set model predictive control (FCS-MPC) shows superior dynamic performance with simple structure for motor drives. However, conventional FCS-MPC method presents unfixed switching frequency, making it intractable for the design of heat s
Publikováno v:
Tsinghua Science and Technology. 27:1-12
When the input signal has been interfered and glitches occur, the power consumption of Double-Edge Triggered Flip-Flops (DETFFs) will significantly increase. To effectively reduce the power consumption, this paper presents an anti-interference low-po
Publikováno v:
IEEE Transactions on Circuits and Systems II: Express Briefs. 69:269-273
A sub-sampling phase-locked loop (SSPLL) with a subsampling delay-locked loop is presented to extend the loop bandwidth and achieve the low jitter. A falling-edge tuning loop is added to align the falling edge of the reference clock with the rising o
Publikováno v:
Nuclear Engineering and Technology, Vol 53, Iss 11, Pp 3790-3797 (2021)
Although the individual channel readout method can improve the performance of PET detectors with pixelated photo-sensors, such as silicon photomultiplier (SiPM), this method leads to a significant increase in the number of readout channels. In this s
Publikováno v:
IEEE Electron Device Letters. 42:1615-1618
Dynamic degradation becomes a critical issue for thin-film transistors (TFTs) used in emerging new displays driven by high frequency gate voltage ${V}_{\text {G}}$ pulses. In this study, ${V}_{\text {G}}$ pulse rising edge dependent dynamic hot carri
Publikováno v:
IEEE Sensors Journal. 21:17732-17737
B-dot sensor, as an important device, is extensively employed to measure the current flowing in the magnetically insulated transmission line (MITL). To shield the output signal of the B-dot sensor from electron flow and high electrical field in the M
Publikováno v:
International Journal of Circuits, Systems and Signal Processing. 15:623-633
Screening out the defects in the TSV manufacturing process and eliminating the resistive open fault and leakage fault as early as possible are beneficial to improve the yield and reliability of 3D ICs. The existing prebond test methods are confined t
Publikováno v:
Journal of Power Electronics. 21:1374-1382
A new method is proposed for the measurement of the junction temperature of insulated gate bipolar transistors (IGBTs) during operation. The application of this method overcomes the problems arising from the complexity of measurement circuits or the
Publikováno v:
JETP Letters. 114:76-80
The destruction of a superinsulating state by pulsed voltage in thin NbTiN films is studied. A delay of the destruction of the superinsulating state after the rising edge of the pulse is discovered. The time of recovery and the time of destruction of
Publikováno v:
Journal of Lightwave Technology. 39:4710-4716
We propose and demonstrate on-chip all-optical control of a single resonance in a graphene-on-silicon nanobeam cavity using thermo-optic (TO) effect. In the design, the graphene sheet covered on the nanobeam cavity is patterned in a “U” shape, wh