Zobrazeno 1 - 10
of 25
pro vyhledávání: '"Siew Kuok Hoon"'
Autor:
Siew Kuok Hoon, Ugur Cilingiroglu
Publikováno v:
ICECS
A novel threshold-voltage extractor architecture is presented. A differential-difference transconductor (DDT) loop automatically biases the device-under-test in continuous time around the inflection point of the /spl radic/I/sub D/ versus V/sub GS/ c
Publikováno v:
IEEE Custom Integrated Circuits Conference 2006; 2006, p213-216, 4p
Publikováno v:
Proceedings of the 31st European Solid-State Circuits Conference, 2005 (ESSCIRC 2005); 2005, p81-84, 4p
Publikováno v:
SoCC
Low-noise, low-dropout (LN-LDO) regulators are critical for supply regulation of deep-submicron analog baseband and RF system-on-chip designs. A low 1/f noise LDO regulator utilizing a chopper stabilized error amplifier is introduced. A secondary amp
Publikováno v:
CICC
Low-noise, low-dropout (LN-LDO) regulators are critical for supply regulation of deep-submicron analog baseband and RF system-on-chip designs. A low 1/f noise LDO regulator utilizing a chopper stabilized error amplifier is presented. In order to achi
Publikováno v:
CICC
This paper presents a novel two-stage low dropout regulator (LDO) that minimizes output noise via a pre-regulator stage and achieves high power supply rejection via a simple subtractor circuit in the power driver stage. The LDO is fabricated with a s
Publikováno v:
Proceedings of the 31st European Solid-State Circuits Conference, 2005. ESSCIRC 2005..
Publikováno v:
ISCAS (4)
This paper describes a novel method to obtain a digital control for PWM DC/DC switching regulator. A passive sigma-delta modulator for which output is suitably processed obtains the PWM control and makes the control loop. The output of the sigma-delt
Publikováno v:
ISCAS (5)
An improved bandgap reference with high power supply rejection (PSR) is presented. The proposed circuit consists of a simple voltage subtractor circuit incorporated into the conventional Brokaw bandgap reference. Essentially, the subtractor feeds the
Publikováno v:
IEEE Transactions on Instrumentation & Measurement; Oct2003, Vol. 52 Issue 5, p1528-1532, 5p