Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Sierra Hoff"'
Autor:
Sami Suihkonen, Turkka O. Tuomi, Harri Lipsanen, Tadao Hashimoto, Sakari Sintonen, Sierra Hoff, Edward Letts, Henri Jussila
Publikováno v:
Journal of Crystal Growth. 406:72-77
White beam synchrotron radiation X-ray topography (SR-XRT) and X-ray diffraction (XRD) measurements were used to non-destructively study the defect structure of a bulk GaN wafer, grown by the ammonothermal method. SR-XRT topographs revealed high crys
Publikováno v:
Journal of Crystal Growth. 403:3-6
This paper reviews the current progress of ammonothermal growth at SixPoint Materials and discusses some of the remaining challenges to commercialize the technology. The mass production of the ammonothermal grown wafers of GaN for high power devices