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pro vyhledávání: '"Sidski, V. V."'
Autor:
Fesenko, O. M., Yaremkevich, A. D., Tsebrienko, T. V., Bydnyk, O. P., Wang, Lei, Semchenko, A. V., Sidski, V. V., Morozovska, A. N.
Micro-Raman spectroscopy and X-ray diffraction have been used to explore the lattice dynamics of Nb-substituted SrBi2(Ta1-xNbx)2O9 (SBTN) crystalline thin films annealed at low temperature, 700oC. It turned out that SrBi2(Ta1-xNbx)2O9 films consist o
Externí odkaz:
http://arxiv.org/abs/2112.04331
Autor:
Morozovska, A. N., Fesenko, O. M., Yaremkevich, A. D., Tsebrienko, T. V., Budnyk, O. P., Wang, Lei, Semchenko, A. V., Sidski, V. V.
Publikováno v:
Applied Nanoscience; Nov2023, Vol. 13 Issue 11, p7171-7185, 15p
