Zobrazeno 1 - 8
of 8
pro vyhledávání: '"Si-Yi Liao"'
Autor:
Hsin-Fei Meng, Si-Yi Liao, Hsiao-Wen Zan, Sheng-fu Horng, Chang Chiung-Wen, Yu Chiang Chao, Yu-Fan Chang, Su Hsiao-Tso, Mu-Chun Niu, Chun Yen, Yung-Hung Hsiao, Chang Chih-Yu
Publikováno v:
SID Symposium Digest of Technical Papers. 50:103-106
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::982d0a3a32f7107d9dc22cc941609ac0
https://doi.org/10.1002/sdtp.13402
https://doi.org/10.1002/sdtp.13402
Autor:
Meu Rurng Tseng, Heh Lung Huang, Hsin-Fei Meng, Yu Chiang Chao, Yu Fan Chang, Chao Hsuan Chen, Lan Sheng Yang, Teng-Chih Chao, Chih-Wei Luo, K.P.O. Mahesh, Si Yi Liao, Hsiao-Wen Zan, Mu Chun Niu, Hsiao Tso Su, Sheng-fu Horng
Publikováno v:
ChemPlusChem. 84:1375-1383
The instability of the organic light-emitting diodes (OLEDs) during operation can be attributed to the existence of point defects on the organic layers. In this work, the effect of mixed-host emissive layer and the thermal annealing treatment were in
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::f7b8e42eca78e7a29fb8af68a417fb66
https://doi.org/10.1002/cplu.201900248
https://doi.org/10.1002/cplu.201900248
Autor:
Yu Chiang Chao, Yu Fan Chang, Si Yi Liao, Sheng-fu Horng, Chun Yen, Chang Chih-Yu, Yung Hung Hsiao, Hsiao Tso Su, Hsin-Fei Meng, Mu Chun Niu, Hsiao-Wen Zan, Chang Chiung-Wen
Publikováno v:
RSC Advances. 9:10584-10598
The electrical current leakage and stability are studied for solution-processed OLEDs with areas of 4.45 mm2, 3 × 3.2 cm2, and 6 × 11.5 cm2. The emission layer of the OLED has a ternary or binary mixed host with hole-transporting molecules tris(4-c
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::03a7122acb7abc57768cbaa42b8ccb99
https://doi.org/10.1039/c8ra10363a
https://doi.org/10.1039/c8ra10363a
Autor:
Si-Yi, Liao, Hsiao-Tso, Su, Yung-Hung, Hsiao, Yu-Fan, Chang, Chiung-Wen, Chang, Mu-Chun, Niu, Hsin-Fei, Meng, Chun, Yen, Yu-Chiang, Chao, Chih-Yu, Chang, Hsiao-Wen, Zan, Sheng-Fu, Horng
Publikováno v:
RSC advances. 9(19)
The electrical current leakage and stability are studied for solution-processed OLEDs with areas of 4.45 mm
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=pmid________::69b05afc8f27c248246a5f3f53c0b16f
https://pubmed.ncbi.nlm.nih.gov/35515314
https://pubmed.ncbi.nlm.nih.gov/35515314
Autor:
Chang, Yu‐Fan1 (AUTHOR) yfchang@nctu.edu.tw, Yang, Lan‐Sheng2 (AUTHOR), Su, Hsiao‐Tso2 (AUTHOR), Liao, Si‐Yi1 (AUTHOR), Niu, Mu‐Chun3 (AUTHOR), Mahesh, K. P. O.3 (AUTHOR), Chen, Chao‐Hsuan4 (AUTHOR), Chao, Yu‐Chiang3 (AUTHOR) ycchao@ntnu.edu.tw, Meng, Hsin‐Fei1 (AUTHOR) meng@mail.nctu.edu.tw, Huang, Heh‐Lung5 (AUTHOR), Chao, Teng‐Chih5 (AUTHOR), Tseng, Meu‐Rurng6 (AUTHOR), Luo, Chih‐Wei2 (AUTHOR), Zan, Hsiao‐Wen4 (AUTHOR), Horng, Sheng‐Fu7 (AUTHOR)
Publikováno v:
ChemPlusChem. Sep2019, Vol. 84 Issue 9, p1375-1383. 9p.
Autor:
Liao, Si-Yi, Su, Hsiao-Tso, Hsiao, Yung-Hung, Chang, Yu-Fan, Chang, Chiung-Wen, Niu, Mu-Chun, Meng, Hsin-Fei, Yen, Chun, Chao, Yu-Chiang, Chang, Chih-Yu, Zan, Hsiao-Wen, Horng, Sheng-Fu
Publikováno v:
SID Symposium Digest of Technical Papers; Sep2019 Supplement S1, Vol. 50, p103-106, 4p
Autor:
林文源
Publikováno v:
Taiwanese Journal of Sociology; jun2019, Issue 65, p127-178, 52p, 7 Diagrams, 3 Charts
Autor:
Liao, Si-Yi, Su, Hsiao-Tso, Hsiao, Yung-Hung, Chang, Yu-Fan, Chang, Chiung-Wen, Niu, Mu-Chun, Meng, Hsin-Fei, Yen, Chun, Chao, Yu-Chiang, Chang, Chih-Yu, Zan, Hsiao-Wen, Horng, Sheng-Fu
Publikováno v:
RSC Advances; 2019, Vol. 9 Issue 19, p10584-10598, 15p