Zobrazeno 1 - 5
of 5
pro vyhledávání: '"Si Young Yie"'
Publikováno v:
EJNMMI Physics, Vol 11, Iss 1, Pp 1-14 (2024)
Abstract Purpose Effective radiation therapy requires accurate segmentation of head and neck cancer, one of the most common types of cancer. With the advancement of deep learning, people have come up with various methods that use positron emission to
Externí odkaz:
https://doaj.org/article/3c7ae6a4a9b248279f98ca3038036703
Publikováno v:
2022 IEEE 19th International Symposium on Biomedical Imaging (ISBI).
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::e1f92f776b820be8e2e79deed825f732
https://doi.org/10.1109/isbi52829.2022.9761632
https://doi.org/10.1109/isbi52829.2022.9761632
Publikováno v:
Lecture Notes in Computer Science ISBN: 9783030982522
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::5a559017de1c4b350ff39efbbccd3c68
https://doi.org/10.1007/978-3-030-98253-9_6
https://doi.org/10.1007/978-3-030-98253-9_6
Publikováno v:
Nucl Med Mol Imaging
PURPOSE: Early deep-learning-based image denoising techniques mainly focused on a fully supervised model that learns how to generate a clean image from the noisy input (noise2clean: N2C). The aim of this study is to explore the feasibility of the sel
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::1a1402f9f438ccba7b5bbdd4f1335255
https://europepmc.org/articles/PMC7704825/
https://europepmc.org/articles/PMC7704825/
Publikováno v:
Electronics
Volume 10
Issue 13
Electronics, Vol 10, Iss 1529, p 1529 (2021)
Volume 10
Issue 13
Electronics, Vol 10, Iss 1529, p 1529 (2021)
The significant statistical noise and limited spatial resolution of positron emission tomography (PET) data in sinogram space results in the degradation of the quality and accuracy of reconstructed images. Although high-dose radiotracers and long acq
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_dedup___::6d8bc976922a739645b1fb667e87da88
https://doi.org/10.3390/electronics10131529
https://doi.org/10.3390/electronics10131529