Zobrazeno 1 - 2
of 2
pro vyhledávání: '"Si Woo Shin"'
Publikováno v:
Journal of the Korea Academia-Industrial cooperation Society. 13:5471-5478
본 논문에서는 SURF 알고리즘을 이용하여 PCB에 발생하는 불량 중 한 형태인 쇼트-서킷 불량을 탐지하는 기술을 제안한다. 제안하는 방법의 기본적인 절차는 SURF를 이용하여 샘플 영상과 입력
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::a09c69cfc55fcd2fad5ea23e820bb48d
https://doi.org/10.5762/kais.2012.13.11.5471
https://doi.org/10.5762/kais.2012.13.11.5471
Autor:
Si Woo Shin, Hun Hwan Ha, Ju Hee Shin, Jeong Heung Kong, Young Sin Choi, Sangho Yun, Young-Hoon Kim, Young Seog Kang, Sunny Kim, YoungSun Nam
Publikováno v:
SPIE Proceedings.
To accord with new requirement of securing more overlay margin, not only the optical overlay measurement is faced with the technical limitations to represent cell pattern’s behavior, but also the larger measurement samples are inevitable for minimi
Externí odkaz:
https://explore.openaire.eu/search/publication?articleId=doi_________::64db28467b91fdd87e282c9f73e8cf83
https://doi.org/10.1117/12.2087196
https://doi.org/10.1117/12.2087196